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Dalton PY - 2010 KW - SRAM chips KW - application specific integrated circuits KW - integrated circuit testing KW - laser beam applications KW - laser beam effects KW - radiation hardening (electronics) KW - silicon-on-insulator KW - two-photon processes KW - ASIC KW - SOI technology KW - SRAM KW - advanced SOI IC technology KW - carrier generation KW - heavy ion LET threshold KW - heavy ion testing KW - heavy ion threshold LET measurement KW - laser energy threshold KW - laser measurements KW - laser pulse KW - size 0.35 mum KW - size 45 nm to 65 nm KW - two photon absorption laser measurement KW - Absorption KW - Charge measurement KW - Current measurement KW - Energy measurement KW - Laboratories KW - NASA KW - Protons KW - Pulse measurements KW - Pulse width modulation KW - Testing KW - Hardness assurance KW - heavy-ion testing KW - laser testing KW - single-event upset KW - threshold LET KW - two-photon absorption DO - 10.1109/TNS.2010.2040754 JO - IEEE Transactions on Nuclear Science IS - 4 SN - 0018-9499 VO - 57 VL - 57 JA - IEEE Transactions on Nuclear Science Y1 - Aug. 2010 ER - TY - JOUR TI - A Study of the Outer Geomagnetic Field T2 - IEEE Transactions on Nuclear Science SP - 10 EP - 19 AU - L. 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