TY - JOUR
TI - Potential interference issues between FCC part 15 compliant UHF ISM emitters and equipment passing standard immunity testing requirements
T2 - IEEE Electromagnetic Compatibility Magazine
SP - 92
EP - 96
AU - D. R. Novotny
AU - J. R. Guerrieri
AU - D. G. Kuester
PY - 2012
KW - UHF devices
KW - electromagnetic interference
KW - immunity testing
KW - radiofrequency identification
KW - telecommunication equipment testing
KW - FCC Part 15 compliance
KW - Part 15.247 compliant emitter
KW - Section 15.247 emitters
KW - UHF ISM emitters
KW - UHF interference potential
KW - electromagnetic interference
KW - equipment passing standard immunity testing requirements
KW - frequency 902 MHz to 928 MHz
KW - immunity regulations
KW - passive UHF RFID
KW - radiofrequency identification
KW - Electric potential
KW - FCC
KW - IEC standards
KW - Immune system
KW - Immunity testing
KW - Radiofrequency identification
DO - 10.1109/MEMC.2012.6347063
JO - IEEE Electromagnetic Compatibility Magazine
IS - 3
SN - 2162-2264
VO - 1
VL - 1
JA - IEEE Electromagnetic Compatibility Magazine
Y1 - Third Quarter 2012
ER -
TY - CONF
TI - Pulse shape discrimination for a fast neutron detector
T2 - 2008 IEEE Nuclear Science Symposium Conference Record
SP - 2984
EP - 2991
AU - K. J. Coakley
AU - D. F. Vecchia
AU - J. S. Nico
AU - B. M. Fisher
PY - 2008
KW - Detectors
KW - Energy measurement
KW - Light scattering
KW - Neutrons
KW - Nuclear electronics
KW - Protons
KW - Pulse measurements
KW - Pulse shaping methods
KW - Shape
KW - Voltage
DO - 10.1109/NSSMIC.2008.4774989
JO - 2008 IEEE Nuclear Science Symposium Conference Record
IS -
SN - 1082-3654
VO -
VL -
JA - 2008 IEEE Nuclear Science Symposium Conference Record
Y1 - 19-25 Oct. 2008
ER -
TY - JOUR
TI - Characteristics of the Ionosphere at Washington, D.C., March, 1938
T2 - Proceedings of the Institute of Radio Engineers
SP - 640
EP - 643
AU - T. R. Gilliland
AU - S. S. Kirby
AU - N. Smith
PY - 1938
KW - Frequency
KW - Ionization
KW - Ionosphere
KW - NIST
KW - Radio communication
KW - Storms
KW - US Department of Commerce
DO - 10.1109/JRPROC.1938.228200
JO - Proceedings of the Institute of Radio Engineers
IS - 5
SN - 0731-5996
VO - 26
VL - 26
JA - Proceedings of the Institute of Radio Engineers
Y1 - May 1938
ER -
TY - JOUR
TI - High-Speed Flip-Flops for the Millimicrosecond Region
T2 - IRE Transactions on Electronic Computers
SP - 121
EP - 125
AU - Z. Bay
AU - N. T. Grisamore
PY - 1956
KW - Capacitance
KW - Electron tubes
KW - Flip-flops
KW - Helium
KW - NIST
KW - Physics
KW - Proposals
KW - Steady-state
KW - Switching circuits
KW - Voltage
DO - 10.1109/TEC.1956.5219931
JO - IRE Transactions on Electronic Computers
IS - 3
SN - 0367-9950
VO - EC-5
VL - EC-5
JA - IRE Transactions on Electronic Computers
Y1 - Sept. 1956
ER -
TY - CONF
TI - Radiation, multimode propagation, and substrate modes in W-band CPW calibrations
T2 - 2011 41st European Microwave Conference
SP - 297
EP - 300
AU - F. J. Schmückle
AU - R. Doerner
AU - G. N. Phung
AU - W. Heinrich
AU - D. Williams
AU - U. Arz
PY - 2011
KW - calibration
KW - coplanar waveguides
KW - network analysers
KW - W-band CPW calibrations
KW - calibration substrate
KW - coplanar waveguide calibration standards
KW - multimode propagation
KW - radiation
KW - substrate modes
KW - vector network analyzer calibrations
KW - Attenuation
KW - Calibration
KW - Conductors
KW - Coplanar waveguides
KW - Frequency measurement
KW - Substrates
KW - Transmission line measurements
KW - CPW
KW - calibration
KW - em simulation
KW - m ea surements
KW - on-wafer
DO -
JO - 2011 41st European Microwave Conference
IS -
SN -
VO -
VL -
JA - 2011 41st European Microwave Conference
Y1 - 10-13 Oct. 2011
ER -
TY - CONF
TI - A Study Of The NBS Time Scale Algorithm
T2 - 1988 Conference on Precision Electromagnetic Measurements
SP - 113
EP - 114
AU - M. A. Weiss
AU - D. W. Allan
AU - T. K. Peppler
PY - 1988
DO - 10.1109/CPEM.1988.671207
JO - 1988 Conference on Precision Electromagnetic Measurements
IS -
SN -
VO -
VL -
JA - 1988 Conference on Precision Electromagnetic Measurements
Y1 - 7-10 June 1988
ER -
TY - JOUR
TI - Shielding-Effectiveness Measurements with a Dual TEM Cell
T2 - IEEE Transactions on Electromagnetic Compatibility
SP - 137
EP - 142
AU - P. F. Wilson
AU - M. T. Ma
PY - 1985
KW - Apertures
KW - Coaxial components
KW - Conducting materials
KW - Electromagnetic measurements
KW - Electromagnetic shielding
KW - Electromagnetic waveguides
KW - Materials testing
KW - Power transmission lines
KW - TEM cells
KW - Transmission line measurements
KW - Shielding measurement technique
KW - aperture model
KW - coupling analysis
KW - dual TEM cell
DO - 10.1109/TEMC.1985.304277
JO - IEEE Transactions on Electromagnetic Compatibility
IS - 3
SN - 0018-9375
VO - EMC-27
VL - EMC-27
JA - IEEE Transactions on Electromagnetic Compatibility
Y1 - Aug. 1985
ER -
TY - CONF
TI - Coherence of fine-structure states of an InAs quantum dot ensemble studied with 2D Fourier-transform spectroscopy
T2 - 2012 Conference on Lasers and Electro-Optics (CLEO)
SP - 1
EP - 2
AU - R. Singh
AU - G. Moody
AU - H. Li
AU - I. A. Akimov
AU - M. Bayer
AU - D. Reuter
AU - A. D. Wieck
AU - S. T. Cundiff
PY - 2012
KW - Fourier transform spectra
KW - III-V semiconductors
KW - high-speed optical techniques
KW - indium compounds
KW - infrared spectra
KW - semiconductor quantum dots
KW - ultraviolet spectra
KW - visible spectra
KW - InAs
KW - coherence decay times
KW - fine-structure coherence states
KW - optical 2D Fourier transform spectroscopy
KW - quantum dot
KW - ultrafast optical processes
KW - Coherence
KW - Nonhomogeneous media
KW - Nonlinear optics
KW - Optical interferometry
KW - Optical pulses
KW - Quantum dots
KW - Spectroscopy
DO - 10.1364/CLEO_AT.2012.JW2A.2
JO - 2012 Conference on Lasers and Electro-Optics (CLEO)
IS -
SN - 2160-8989
VO -
VL -
JA - 2012 Conference on Lasers and Electro-Optics (CLEO)
Y1 - 6-11 May 2012
ER -
TY - JOUR
TI - Free and Open Source Software
T2 - IT Professional
SP - 14
EP - 16
AU - K. W. Miller
AU - J. Voas
AU - T. Costello
PY - 2010
KW - industrial property
KW - open systems
KW - public domain software
KW - software development management
KW - free software
KW - intellectual property business
KW - interoperability strategy
KW - open source software
KW - software business
KW - Computers
KW - Licenses
KW - NIST
KW - Open source software
KW - Open systems
KW - FOSS
KW - Free and open source software
KW - information technology
DO - 10.1109/MITP.2010.147
JO - IT Professional
IS - 6
SN - 1520-9202
VO - 12
VL - 12
JA - IT Professional
Y1 - Nov.-Dec. 2010
ER -
TY - CONF
TI - Silicon nanowire nonvolatile-memory with varying HfO2 charge trapping layer thickness
T2 - 2009 International Semiconductor Device Research Symposium
SP - 1
EP - 2
AU - X. Zhu
AU - Q. Li
AU - D. E. Ioannou
AU - D. Gu
AU - H. Baumgart
AU - J. E. Bonevich
AU - J. S. Suehle
AU - C. A. Richter
PY - 2009
KW - aluminium compounds
KW - electron traps
KW - hafnium compounds
KW - hole traps
KW - nanowires
KW - random-access storage
KW - silicon compounds
KW - Al2O3-HfO2-SiO2
KW - TCAD simulation
KW - charge trap
KW - fast programming/erasing speed
KW - self-aligning process
KW - silicon nanowire nonvolatile memory
KW - Aluminum oxide
KW - Consumer electronics
KW - Degradation
KW - Electron traps
KW - Hafnium oxide
KW - Lithography
KW - Nanowires
KW - Nonvolatile memory
KW - Silicon
KW - Tunneling
DO - 10.1109/ISDRS.2009.5378132
JO - 2009 International Semiconductor Device Research Symposium
IS -
SN -
VO -
VL -
JA - 2009 International Semiconductor Device Research Symposium
Y1 - 9-11 Dec. 2009
ER -
TY - CONF
TI - Excitons, biexcitons, and trions in an InAs quantum dot ensemble studied with 2D Fourier-transform spectroscopy
T2 - 2012 Conference on Lasers and Electro-Optics (CLEO)
SP - 1
EP - 2
AU - G. Moody
AU - R. Singh
AU - H. Li
AU - I. A. Akimov
AU - M. Bayer
AU - D. Reuter
AU - A. D. Wieck
AU - S. T. Cundiff
PY - 2012
KW - Fourier transform spectra
KW - III-V semiconductors
KW - biexcitons
KW - indium compounds
KW - semiconductor quantum dots
KW - trions
KW - two-dimensional spectra
KW - 2D Fourier-transform spectroscopy
KW - InAs
KW - InAs quantum dot ensemble
KW - biexcitons
KW - excitation density
KW - excitation polarization
KW - fifth-order contribution
KW - multiparticle correlations
KW - trion signatures
KW - Correlation
KW - Excitons
KW - Optical coupling
KW - Optical polarization
KW - Quantum dots
KW - Spectroscopy
KW - Trions
DO - 10.1364/QELS.2012.QM3G.3
JO - 2012 Conference on Lasers and Electro-Optics (CLEO)
IS -
SN - 2160-8989
VO -
VL -
JA - 2012 Conference on Lasers and Electro-Optics (CLEO)
Y1 - 6-11 May 2012
ER -
TY - JOUR
TI - The National Bureau of Standards and its Possible Technical Relations to the Motion Picture Industry
T2 - Transactions of the Society of Motion Picture Engineers
SP - 61
EP - 69
AU - G. K. Burgess
PY - 1926
DO - 10.5594/J00793
JO - Transactions of the Society of Motion Picture Engineers
IS - 26
SN - 0096-6460
VO - 10
VL - 10
JA - Transactions of the Society of Motion Picture Engineers
Y1 - May 1926
ER -
TY - CONF
TI - A new interface defect spectroscopy method
T2 - 2011 International Reliability Physics Symposium
SP - 3A.4.1
EP - 3A.4.5
AU - J. T. Ryan
AU - L. C. Yu
AU - J. H. Han
AU - J. J. Kopanski
AU - K. P. Cheung
AU - F. Zhang
AU - C. Wang
AU - J. P. Campbell
AU - J. S. Suehle
AU - V. Tilak
AU - J. Fronheiser
PY - 2011
KW - defect states
KW - interface states
KW - semiconductor devices
KW - spectroscopy
KW - Si-SiO2
KW - interface defect spectroscopy method
KW - material system
KW - production quality submicron device
KW - variable height charge pumping
KW - Charge pumps
KW - Current measurement
KW - Filling
KW - Frequency measurement
KW - Interface states
KW - Lead
KW - Silicon
KW - Pb centers
KW - charge pumping
KW - interface states
DO - 10.1109/IRPS.2011.5784477
JO - 2011 International Reliability Physics Symposium
IS -
SN - 1541-7026
VO -
VL -
JA - 2011 International Reliability Physics Symposium
Y1 - 10-14 April 2011
ER -
TY - JOUR
TI - Letters
T2 - IEEE Antennas and Propagation Society Newsletter
SP - 12
EP - 12
AU - J. Wait
AU - H. Schuman
AU - R. Hansen
PY - 1977
DO - 10.1109/MAP.1977.27284
JO - IEEE Antennas and Propagation Society Newsletter
IS - 2
SN - 2168-0329
VO - 19
VL - 19
JA - IEEE Antennas and Propagation Society Newsletter
Y1 - April 1977
ER -
TY - JOUR
TI - A Source of Error in Radio Phase Measuring Systems
T2 - Proceedings of the IRE
SP - 612
EP - 614
AU - R. Bateman
AU - E. F. Florman
AU - A. Tait
PY - 1950
KW - Antenna measurements
KW - Artificial intelligence
KW - Calibration
KW - Circuit testing
KW - Local oscillators
KW - Phase measurement
KW - Radio navigation
KW - Radio transmitters
KW - Receivers
KW - Telephony
DO - 10.1109/JRPROC.1950.232470
JO - Proceedings of the IRE
IS - 6
SN - 0096-8390
VO - 38
VL - 38
JA - Proceedings of the IRE
Y1 - June 1950
ER -
TY - JOUR
TI - Calibration of the Effective Tunneling Bandgap in GaAsSb/InGaAs for Improved TFET Performance Prediction
T2 - IEEE Transactions on Electron Devices
SP - 4248
EP - 4254
AU - Q. Smets
AU - A. S. Verhulst
AU - S. El Kazzi
AU - D. Gundlach
AU - C. A. Richter
AU - A. Mocuta
AU - N. Collaert
AU - A. V. Y. Thean
AU - M. M. Heyns
PY - 2016
KW - III-V semiconductors
KW - calibration
KW - field effect transistors
KW - gallium arsenide
KW - indium compounds
KW - p-i-n diodes
KW - semiconductor device models
KW - semiconductor heterojunctions
KW - tunnel transistors
KW - In0.53Ga0.47As-GaAs0.5Sb0.5
KW - dopant-dependent bandgap narrowing
KW - effective tunneling bandgap calibration
KW - fitting parameter
KW - heterojunction band-to-band tunneling
KW - heterojunction p+-i-n+ diodes
KW - heterojunction tunneling FET
KW - highly doped TFET
KW - improved TFET performance prediction
KW - Calibration
KW - Current measurement
KW - Heterojunctions
KW - Photonic band gap
KW - TFETs
KW - Temperature dependence
KW - Tunneling
KW - Band-to-band tunneling (BTBT)
KW - Esaki diode
KW - calibration
KW - heterojunction
KW - tunneling field-effect transistor (TFET)
DO - 10.1109/TED.2016.2604860
JO - IEEE Transactions on Electron Devices
IS - 11
SN - 0018-9383
VO - 63
VL - 63
JA - IEEE Transactions on Electron Devices
Y1 - Nov. 2016
ER -
TY - JOUR
TI - The microwave measurement of variations in atmospheric refractive index
T2 - Transactions of the IRE Professional Group on Antennas and Propagation
SP - 74
EP - 78
PY - 1952
KW - Microwave radio propagation meteorological factors
KW - Atmosphere
KW - Atmospheric measurements
KW - Frequency
KW - Klystrons
KW - Microwave devices
KW - Microwave measurements
KW - Poles and towers
KW - Refractive index
KW - Stability
KW - Switches
DO -
JO - Transactions of the IRE Professional Group on Antennas and Propagation
IS -
SN - 2168-0639
VO - PGAP-3
VL - PGAP-3
JA - Transactions of the IRE Professional Group on Antennas and Propagation
Y1 - Aug 1952
ER -
TY - CONF
TI - Molecular alignment and Rashba splitting in organometal halide perovskite CH3NH3PbI3 absorbers
T2 - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
SP - 1
EP - 4
AU - Junwen Li
AU - P. M. Haney
PY - 2015
KW - conduction bands
KW - couplings
KW - density functional theory
KW - halides
KW - organic compounds
KW - organometallic compounds
KW - solar absorber-convertors
KW - solar cells
KW - spin-orbit interactions
KW - valence bands
KW - Rashba splitting
KW - conduction band
KW - density-functional theory
KW - electrical properties
KW - electronic structure
KW - ferroelectric ordering
KW - induced structural distortion
KW - molecular alignment
KW - optical properties
KW - organometal halide perovskite CH3NH3PbI3 absorber
KW - organometal halide perovskite CH3NH3PbI3 solar cell
KW - power conversion efficiency
KW - strong spin-orbit coupling
KW - symmetry reduction
KW - valence band
KW - Absorption
KW - Charge carrier processes
KW - Microscopy
KW - Optical distortion
KW - Optical polarization
KW - Photovoltaic systems
KW - Rashba splitting
KW - molecular alignment
KW - organometal halide perovskite
DO - 10.1109/PVSC.2015.7355729
JO - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
IS -
SN -
VO -
VL -
JA - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
Y1 - 14-19 June 2015
ER -
TY - CONF
TI - Characterizing reverberation chambers by measurements of the enhanced backscatter coefficient
T2 - 2012 IEEE International Symposium on Electromagnetic Compatibility
SP - 210
EP - 215
AU - C. R. Dunlap
AU - C. L. Holloway
AU - R. Pirkl
AU - J. Ladbury
AU - E. F. Kuester
AU - D. A. Hill
AU - S. van de Beek
PY - 2012
KW - reverberation chambers
KW - alternative testing facility
KW - electromagnetic applications
KW - enhanced backscatter coefficient measurements
KW - field uniformity measurement
KW - reverberation chambers
KW - Antenna measurements
KW - Backscatter
KW - Receiving antennas
KW - Reverberation chamber
KW - Standards
KW - Transmitting antennas
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JO - 2012 IEEE International Symposium on Electromagnetic Compatibility
IS -
SN - 2158-110X
VO -
VL -
JA - 2012 IEEE International Symposium on Electromagnetic Compatibility
Y1 - 6-10 Aug. 2012
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TI - On the excitation of electromagnetic surface waves on a curved surface
T2 - IRE Transactions on Antennas and Propagation
SP - 445
EP - 448
AU - J. Wait
PY - 1960
KW - Electromagnetic surface waves
KW - Spheres
KW - Surface electromagnetic waves
KW - Attenuation
KW - Conductors
KW - Corrugated surfaces
KW - Dielectrics
KW - Electromagnetic propagation
KW - Electromagnetic radiation
KW - Electromagnetic scattering
KW - Helium
KW - Magnetic fields
KW - Surface waves
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JO - IRE Transactions on Antennas and Propagation
IS - 4
SN - 0096-1973
VO - 8
VL - 8
JA - IRE Transactions on Antennas and Propagation
Y1 - July 1960
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TY - CONF
TI - Round-robin studies of two potential seebeck coefficient standard reference materials
T2 - 2007 26th International Conference on Thermoelectrics
SP - 361
EP - 365
AU - N. D. Lowhorn
AU - W. Wong-Ng
AU - W. Zhang
AU - Z. Q. Lu
AU - M. Otani
AU - E. Thomas
AU - M. Green
AU - T. N. Tran
AU - N. Dilley
AU - N. Elsner
AU - T. Hogan
AU - Q. Li
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AU - J. Sharp
AU - R. Venkatasubramanian
AU - R. Willigan
AU - J. Yang
AU - G. Nolas
AU - T. Tritt
PY - 2007
KW - Seebeck effect
KW - bismuth compounds
KW - copper alloys
KW - measurement standards
KW - nickel alloys
KW - Bi2Te3
KW - CuNi
KW - NIST
KW - Seebeck coefficient SRM
KW - constantan
KW - round-robin measurement survey
KW - standard reference materials
KW - thermoelectric materials
KW - Calibration
KW - Conducting materials
KW - Conductivity measurement
KW - Electric resistance
KW - Electric variables measurement
KW - Instruments
KW - NIST
KW - Standards development
KW - Thermal conductivity
KW - Thermoelectricity
DO - 10.1109/ICT.2007.4569495
JO - 2007 26th International Conference on Thermoelectrics
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SN - 1094-2734
VO -
VL -
JA - 2007 26th International Conference on Thermoelectrics
Y1 - 3-7 June 2007
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TY - JOUR
TI - New low-voltage standaards in the DC to 1-MHz frequency range
T2 - IEEE Transactions on Instrumentation and Measurement
SP - 368
EP - 372
AU - N. M. Oldham
AU - M. Henderson
PY - 1991
KW - Connectors
KW - Frequency measurement
KW - Inductance
KW - Instruments
KW - Manufacturing
KW - Measurement standards
KW - Measurement techniques
KW - Signal generators
KW - Tellurium
KW - Voltage
DO - 10.1109/TIM.1990.1032962
JO - IEEE Transactions on Instrumentation and Measurement
IS - 2
SN - 0018-9456
VO - 40
VL - 40
JA - IEEE Transactions on Instrumentation and Measurement
Y1 - Apr 1991
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TY - JOUR
TI - A Harmonic Method of Intercomparing the Oscillators of the National Standard of Radio Frequency
T2 - Proceedings of the Institute of Radio Engineers
SP - 1495
EP - 1500
AU - E. G. Lapham
PY - 1936
KW - Frequency conversion
KW - Frequency measurement
KW - Measurement standards
KW - NIST
KW - Network address translation
KW - Oscillators
KW - Radio frequency
KW - Radiofrequency integrated circuits
KW - US Department of Commerce
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JO - Proceedings of the Institute of Radio Engineers
IS - 11
SN - 0731-5996
VO - 24
VL - 24
JA - Proceedings of the Institute of Radio Engineers
Y1 - Nov. 1936
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TY - CONF
TI - A calculable, transportable audio-frequency AC reference standard
T2 - 1988 Conference on Precision Electromagnetic Measurements
SP - 46
EP - 47
AU - N. M. Oldham
AU - P. S. Hetrick
AU - Zeng Xiangren
PY - 1988
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JO - 1988 Conference on Precision Electromagnetic Measurements
IS -
SN -
VO -
VL -
JA - 1988 Conference on Precision Electromagnetic Measurements
Y1 - 7-10 June 1988
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TY - JOUR
TI - The NBS-LANL RTM End-Magnet Field Mapper
T2 - IEEE Transactions on Nuclear Science
SP - 3605
EP - 3607
AU - E. R. Lindstrom
AU - P. H. Debenham
AU - D. L. Mohr
AU - N. R. Yoder
PY - 1983
KW - Automatic control
KW - Grid computing
KW - Hall effect
KW - Magnetic field measurement
KW - Magnetic fields
KW - Magnetometers
KW - Magnets
KW - NIST
KW - Nuclear magnetic resonance
KW - Probes
DO - 10.1109/TNS.1983.4336740
JO - IEEE Transactions on Nuclear Science
IS - 4
SN - 0018-9499
VO - 30
VL - 30
JA - IEEE Transactions on Nuclear Science
Y1 - Aug. 1983
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TI - Throughput study for admission control in IEEE 802.11 DCF with ARF
T2 - IEEE Communications Letters
SP - 432
EP - 434
AU - K. Hong
AU - S. Lee
AU - N. Golmie
PY - 2009
KW - telecommunication standards
KW - telecommunication traffic
KW - wireless LAN
KW - IEEE 802.11
KW - WLAN
KW - admission control
KW - auto rate fallback
KW - distributed coordination function
KW - saturated traffic conditions
KW - Admission control
KW - Analytical models
KW - Cross layer design
KW - Error analysis
KW - NIST
KW - Performance analysis
KW - Telecommunication traffic
KW - Throughput
KW - Traffic control
KW - Wireless LAN
KW - Throughput, ARF, DCF, admission control
DO - 10.1109/LCOMM.2009.090108
JO - IEEE Communications Letters
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SN - 1089-7798
VO - 13
VL - 13
JA - IEEE Communications Letters
Y1 - June 2009
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TI - A Significance Test for Reverberation-Chamber Measurement Uncertainty in Total Radiated Power of Wireless Devices
T2 - IEEE Transactions on Electromagnetic Compatibility
SP - 207
EP - 219
AU - K. A. Remley
AU - C. M. J. Wang
AU - D. F. Williams
AU - J. J. aan den Toorn
AU - C. L. Holloway
PY - 2016
KW - code division multiple access
KW - measurement uncertainty
KW - reverberation chambers
KW - W-CDMA protocol
KW - machine-to-machine device
KW - reverberation-chamber measurement uncertainty
KW - significance test
KW - spatial uniformity
KW - stepped mode-stirring
KW - total radiated power
KW - wideband code-division-multiple-access
KW - wireless devices
KW - Antenna measurements
KW - Antennas
KW - Loading
KW - Measurement uncertainty
KW - Power measurement
KW - Uncertainty
KW - Wireless communication
KW - Measurement uncertainty
KW - over-the-air (OTA) testing
KW - reverberation chamber
KW - wireless system
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JO - IEEE Transactions on Electromagnetic Compatibility
IS - 1
SN - 0018-9375
VO - 58
VL - 58
JA - IEEE Transactions on Electromagnetic Compatibility
Y1 - Feb. 2016
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TI - The use of Fick's law in modeling diffusion processes
T2 - IEEE Transactions on Electron Devices
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EP - 1798
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AU - R. D. Larrabee
PY - 1980
KW - Chemicals
KW - Diffusion processes
KW - Electron devices
KW - Equations
KW - Fabrication
KW - Isobaric
KW - NIST
KW - Semiconductor impurities
KW - Thermal force
KW - Thermodynamics
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JO - IEEE Transactions on Electron Devices
IS - 9
SN - 0018-9383
VO - 27
VL - 27
JA - IEEE Transactions on Electron Devices
Y1 - Sep 1980
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TI - On-Line Handling System for the NBS Linac
T2 - IEEE Transactions on Nuclear Science
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EP - 337
AU - J. Broberg
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AU - J. M. Wyckoff
PY - 1964
KW - Analog-digital conversion
KW - Concurrent computing
KW - Control systems
KW - Linear particle accelerator
KW - NIST
KW - Nuclear physics
KW - Privacy
KW - Real time systems
KW - Registers
KW - Switches
DO - 10.1109/TNS.1964.4323444
JO - IEEE Transactions on Nuclear Science
IS - 3
SN - 0018-9499
VO - 11
VL - 11
JA - IEEE Transactions on Nuclear Science
Y1 - June 1964
ER -
TY - CONF
TI - Application of CMOS-Compatible Micro-Hotplates for In-situ Process Monitors
T2 - International Report on Wafer Level Reliability Workshop
SP - 122
EP - 132
AU - J. S. Suehle
AU - M. Gaitan
PY - 1992
KW - Aluminum
KW - Conductivity
KW - Contacts
KW - Etching
KW - Fabrication
KW - NIST
KW - Silicon
KW - Substrates
KW - Temperature sensors
KW - Testing
DO - 10.1109/IWLR.1992.657994
JO - International Report on Wafer Level Reliability Workshop
IS -
SN -
VO -
VL -
JA - International Report on Wafer Level Reliability Workshop
Y1 - 25-28 Oct. 1992
ER -
TY - JOUR
TI - Preliminary Note on an Automatic Recorder Giving a Continuous Height Record of the Kennelly-Heaviside Layer
T2 - Proceedings of the Institute of Radio Engineers
SP - 540
EP - 547
AU - T. R. Gilliland
AU - G. W. Kenrick
PY - 1932
KW - Choppers
KW - Mars
KW - Mirrors
KW - Power system measurements
KW - Pulse measurements
KW - Reflection
KW - Standards publication
KW - Synchronous motors
KW - Transmitters
KW - US Department of Commerce
DO - 10.1109/JRPROC.1932.227589
JO - Proceedings of the Institute of Radio Engineers
IS - 3
SN - 0731-5996
VO - 20
VL - 20
JA - Proceedings of the Institute of Radio Engineers
Y1 - March 1932
ER -
TY - CONF
TI - Real-time control system software: Some problems and an approach
T2 - Proceedings. 1986 IEEE International Conference on Robotics and Automation
SP - 1705
EP - 1716
AU - L. Haynes
AU - A. Wavering
PY - 1986
KW - Automatic control
KW - Control systems
KW - Data engineering
KW - Manufacturing automation
KW - Motion control
KW - NIST
KW - Production facilities
KW - Real time systems
KW - Robot motion
KW - System software
DO - 10.1109/ROBOT.1986.1087418
JO - Proceedings. 1986 IEEE International Conference on Robotics and Automation
IS -
SN -
VO - 3
VL - 3
JA - Proceedings. 1986 IEEE International Conference on Robotics and Automation
Y1 - Apr 1986
ER -
TY - JOUR
TI - Applying the Visual Double-Modulation Type Radio Range to the Airways
T2 - Proceedings of the Institute of Radio Engineers
SP - 2158
EP - 2184
AU - H. Diamond
PY - 1929
KW - Airplanes
KW - Amplitude modulation
KW - Employment
KW - Frequency
KW - Goniometers
KW - Mathematical analysis
KW - Standards publication
KW - Transmitting antennas
KW - Visual system
KW - Wire
DO - 10.1109/JRPROC.1929.221645
JO - Proceedings of the Institute of Radio Engineers
IS - 12
SN - 0731-5996
VO - 17
VL - 17
JA - Proceedings of the Institute of Radio Engineers
Y1 - Dec. 1929
ER -
TY - JOUR
TI - Characteristics of the Ionosphere at Washington, D.C., July, 1939
T2 - Proceedings of the IRE
SP - 603
EP - 604
AU - T. R. Gilliland
AU - S. S. Kirby
AU - N. Smith
PY - 1939
KW - Associate members
KW - Clouds
KW - Frequency
KW - Hafnium
KW - Ionosphere
KW - NIST
KW - Radio transmitters
KW - Reflection
KW - Storms
KW - US Department of Commerce
DO - 10.1109/JRPROC.1939.228759
JO - Proceedings of the IRE
IS - 9
SN - 0096-8390
VO - 27
VL - 27
JA - Proceedings of the IRE
Y1 - Sept. 1939
ER -
TY - CONF
TI - Circular polarization selective aluminum nano-spirals at ultraviolet wavelengths
T2 - 2016 Conference on Lasers and Electro-Optics (CLEO)
SP - 1
EP - 2
AU - M. S. Davis
AU - J. Strait
AU - J. K. Lee
AU - S. Blair
AU - A. Agrawal
AU - H. J. Lezec
PY - 2016
KW - aluminium
KW - chirality
KW - light polarisation
KW - nanophotonics
KW - nanostructured materials
KW - Al
KW - circular polarization selective aluminum chiral nanospirals
KW - flat-optical device
KW - glass substrate
KW - subwavelength distances
KW - ultraviolet light
KW - Nanoscale devices
KW - Optical polarization
KW - Optical reflection
KW - Plasmons
KW - Spirals
KW - Substrates
DO -
JO - 2016 Conference on Lasers and Electro-Optics (CLEO)
IS -
SN -
VO -
VL -
JA - 2016 Conference on Lasers and Electro-Optics (CLEO)
Y1 - 5-10 June 2016
ER -
TY - CONF
TI - The ATP at NIST
T2 - Proceedings 2002 IEEE 4th International Workshop on Networked Appliances (Cat. No.02EX525)
SP - 1
EP - 9
AU - O. Omidvar
PY - 2002
KW - Bandwidth
KW - Ecosystems
KW - Environmental economics
KW - Home appliances
KW - Investments
KW - NIST
KW - Personal communication networks
KW - Power industry
KW - Video sharing
DO - 10.1109/IWNA.2002.980792
JO - Proceedings 2002 IEEE 4th International Workshop on Networked Appliances (Cat. No.02EX525)
IS -
SN -
VO -
VL -
JA - Proceedings 2002 IEEE 4th International Workshop on Networked Appliances (Cat. No.02EX525)
Y1 - 15-16 Jan. 2002
ER -
TY - JOUR
TI - Optical Probe for Nondestructive Wafer-Scale Characterization of Photonic Elements
T2 - IEEE Photonics Technology Letters
SP - 643
EP - 646
AU - T. Michels
AU - V. Aksyuk
PY - 2017
KW - Couplings
KW - Optical coupling
KW - Optical device fabrication
KW - Optical surface waves
KW - Optical waveguides
KW - Probes
KW - Silicon
KW - Optical probe
KW - SPM
KW - wafer-scale testing
DO - 10.1109/LPT.2017.2660439
JO - IEEE Photonics Technology Letters
IS - 8
SN - 1041-1135
VO - 29
VL - 29
JA - IEEE Photonics Technology Letters
Y1 - April15, 15 2017
ER -
TY - JOUR
TI - A review of contention resolution algorithms for IEEE 802.14 networks
T2 - IEEE Communications Surveys
SP - 2
EP - 12
AU - N. Golmie
AU - Y. Saintillan
AU - D. H. Su
PY - 1999
KW - IEEE standards
KW - access protocols
KW - cable television
KW - channel allocation
KW - hybrid fibre coax networks
KW - HFC cable networks
KW - IEEE 802.14 networks
KW - MAC layer protocols
KW - contention resolution algorithms
KW - hybrid fiber coaxial systems
KW - medium access control
KW - multiaccess medium allocation
KW - p-persistence algorithm
KW - roundtrip delay
KW - tree-based algorithms
KW - upstream channel allocation
KW - Access protocols
KW - Cable TV
KW - Channel allocation
KW - Coaxial cables
KW - Hybrid fiber coaxial cables
KW - IEEE activities
KW - Media Access Protocol
KW - Optical fiber cables
KW - TV broadcasting
KW - Telecommunication traffic
DO - 10.1109/COMST.1999.5340508
JO - IEEE Communications Surveys
IS - 1
SN -
VO - 2
VL - 2
JA - IEEE Communications Surveys
Y1 - First Quarter 1999
ER -
TY - CONF
TI - Improvement in the evaluation of a rectangular waveguide microcalorimeter correction factora
T2 - 29th Conference on Precision Electromagnetic Measurements (CPEM 2014)
SP - 746
EP - 747
AU - W. Fang
AU - T. P. Crowley
PY - 2014
KW - calorimeters
KW - measurement standards
KW - measurement uncertainty
KW - millimetre wave measurement
KW - power measurement
KW - rectangular waveguides
KW - reflection
KW - correction factor
KW - frequency 50 GHz to 75 GHz
KW - measurement uncertainty
KW - microcalorimeters
KW - rectangular waveguide
KW - reflection coefficient
KW - transmission coefficient
KW - Measurement uncertainty
KW - Millimeter wave measurements
KW - Power measurement
KW - Radio frequency
KW - Standards
KW - Transmission line measurements
KW - Uncertainty
KW - Bolometer
KW - Calorimetry
KW - Millimeter wave measurement
KW - Power measurement
DO - 10.1109/CPEM.2014.6898601
JO - 29th Conference on Precision Electromagnetic Measurements (CPEM 2014)
IS -
SN - 0589-1485
VO -
VL -
JA - 29th Conference on Precision Electromagnetic Measurements (CPEM 2014)
Y1 - 24-29 Aug. 2014
ER -
TY - CONF
TI - Efficient single-photon-level quantum frequency conversion on a silicon nanophotonic chip
T2 - 2015 Conference on Lasers and Electro-Optics (CLEO)
SP - 1
EP - 2
AU - Q. Li
AU - M. Davanco
AU - K. Srinivasan
PY - 2015
KW - elemental semiconductors
KW - integrated optoelectronics
KW - multiwave mixing
KW - nanophotonics
KW - optical frequency conversion
KW - optical noise
KW - optical pumping
KW - quantum optics
KW - silicon
KW - silicon compounds
KW - Si
KW - Si3N4
KW - four-wave-mixing Bragg scattering
KW - low power continuous wave pump lasers
KW - microring
KW - signal-to-noise level
KW - silicon nanophotonic chip
KW - single-photon-level quantum frequency conversion
KW - single-photon-level signals
KW - Couplings
KW - Dispersion
KW - Frequency conversion
KW - Optical ring resonators
KW - Optical variables measurement
KW - Photonics
KW - Signal to noise ratio
DO -
JO - 2015 Conference on Lasers and Electro-Optics (CLEO)
IS -
SN - 2160-8989
VO -
VL -
JA - 2015 Conference on Lasers and Electro-Optics (CLEO)
Y1 - 10-15 May 2015
ER -
TY - CONF
TI - Electromagnetic properties of iron oxide corrosion product powders at radio frequencies
T2 - 2012 Conference on Precision electromagnetic Measurements
SP - 640
EP - 641
AU - S. Kim
AU - J. Surek
AU - J. Baker-Jarvis
AU - V. Provenzano
PY - 2012
KW - S-parameters
KW - absorption
KW - aluminium compounds
KW - calcium compounds
KW - corrosion
KW - corrosion testing
KW - iron compounds
KW - network analysers
KW - permeability
KW - permittivity
KW - powders
KW - rebar
KW - refractive index measurement
KW - reinforced concrete
KW - steel
KW - temperature measurement
KW - waveguides
KW - CaO-Al2O3-Fe2O3
KW - Fe2O3
KW - Fe3O4
KW - FeOOH
KW - S-parameter data
KW - atomic structure
KW - bridge girder corrosion powder
KW - calcium ferroaluminate
KW - concrete
KW - corrosion product powder
KW - corrosion sample testing
KW - electromagnetic property
KW - flat spectral response
KW - frequency 12.4 GHz to 110 GHz
KW - goethite
KW - hematite
KW - low-loss sampling
KW - maghemite
KW - magnetite
KW - modal noise minimization
KW - network analyzer measurement
KW - permeability
KW - permittivity
KW - radiofrequency
KW - rebar
KW - refractive index calculation
KW - refractive index measurement
KW - resonance absorption
KW - room-temperature measurement
KW - spectral signature
KW - steel reinforcement
KW - temperature 293 K to 298 K
KW - Concrete
KW - Corrosion
KW - Iron
KW - Permeability
KW - Permittivity
KW - Powders
KW - Refractive index
KW - Corrosion
KW - iron oxide
KW - powder
KW - radio frequencies
KW - refractive index
DO - 10.1109/CPEM.2012.6251092
JO - 2012 Conference on Precision electromagnetic Measurements
IS -
SN - 0589-1485
VO -
VL -
JA - 2012 Conference on Precision electromagnetic Measurements
Y1 - 1-6 July 2012
ER -
TY - CONF
TI - Comparison of SOLR and TRL Calibrations
T2 - 51st ARFTG Conference Digest
SP - 83
EP - 87
AU - D. K. Walker
AU - D. F. Williams
PY - 1998
KW - Calibration
KW - Coplanar waveguides
KW - Frequency measurement
KW - Gold
KW - Impedance
KW - NIST
KW - Probes
KW - Scattering parameters
KW - Substrates
KW - Transmission lines
DO - 10.1109/ARFTG.1998.327283
JO - 51st ARFTG Conference Digest
IS -
SN -
VO - 33
VL - 33
JA - 51st ARFTG Conference Digest
Y1 - June 1998
ER -
TY - JOUR
TI - Handling High Power Electron Beams
T2 - IEEE Transactions on Nuclear Science
SP - 908
EP - 917
AU - S. Penner
PY - 1967
KW - Chemical products
KW - Corrosion
KW - Electron accelerators
KW - Electron beams
KW - Fatigue
KW - Gases
KW - Particle beams
KW - Production
KW - Radioactive materials
KW - Water heating
DO - 10.1109/TNS.1967.4324679
JO - IEEE Transactions on Nuclear Science
IS - 3
SN - 0018-9499
VO - 14
VL - 14
JA - IEEE Transactions on Nuclear Science
Y1 - June 1967
ER -
TY - CONF
TI - Charge Trapping and Breakdown Mechanism in Simox
T2 - 1992 IEEE International SOI Conference
SP - 28
EP - 29
AU - S. Mayo
AU - J. S. Suehle
AU - P. Roitman
PY - 1992
KW - Capacitance-voltage characteristics
KW - Capacitors
KW - Current measurement
KW - Degradation
KW - Electric breakdown
KW - Electron traps
KW - Insulation
KW - Integrated circuit technology
KW - NIST
KW - Oxygen
DO - 10.1109/SOI.1992.664779
JO - 1992 IEEE International SOI Conference
IS -
SN - 1078-621X
VO -
VL -
JA - 1992 IEEE International SOI Conference
Y1 - 6-8 Oct. 1992
ER -
TY - JOUR
TI - Report of the Chairman of the Commission on Radio Wave Propagation, International Union of Scientific Radio Telegraphy
T2 - Proceedings of the Institute of Radio Engineers
SP - 348
EP - 358
AU - L. W. Austin
PY - 1928
DO - 10.1109/JRPROC.1928.221401
JO - Proceedings of the Institute of Radio Engineers
IS - 3
SN - 0731-5996
VO - 16
VL - 16
JA - Proceedings of the Institute of Radio Engineers
Y1 - March 1928
ER -
TY - CONF
TI - Atom-based RF electric field measurements: An initial investigation of the measurement uncertainties
T2 - 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)
SP - 467
EP - 472
AU - C. L. Holloway
AU - J. A. Gordon
AU - M. T. Simons
AU - H. Fan
AU - S. Kumar
AU - J. P. Shaffer
AU - D. A. Anderson
AU - A. Schwarzkopf
AU - S. A. Miller
AU - N. Thaicharoen
AU - G. Raithel
PY - 2015
KW - electric field measurement
KW - measurement uncertainty
KW - E-field measurement techniques
KW - alkali atoms
KW - atom-based RF electric field measurements
KW - direct SI-traceable E-field probe
KW - glass cells
KW - measurement uncertainties
KW - radio frequency E-field interactions
KW - Atomic beams
KW - Atomic clocks
KW - Atomic measurements
KW - Measurement uncertainty
KW - Probes
KW - Radio frequency
KW - Uncertainty
DO - 10.1109/ISEMC.2015.7256207
JO - 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)
IS -
SN - 2158-110X
VO -
VL -
JA - 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)
Y1 - 16-22 Aug. 2015
ER -
TY - CONF
TI - Alignment and testing of the NIST calculable capacitor
T2 - 29th Conference on Precision Electromagnetic Measurements (CPEM 2014)
SP - 476
EP - 477
AU - Y. Wang
AU - F. G. Cervantes
AU - C. Stambaugh
AU - R. Smíd
AU - H. Z. Calvo
AU - A. Koffman
AU - J. R. Pratt
AU - J. Lawall
PY - 2014
KW - Fabry-Perot interferometers
KW - capacitors
KW - electrodes
KW - motion control
KW - NIST calculable capacitor testing
KW - guard electrode motion control
KW - multiwavelength Fabry-Perot interferometer
KW - overall electrode alignment
KW - Capacitors
KW - Electrodes
KW - Measurement by laser beam
KW - NIST
KW - Optical interferometry
KW - Optical sensors
KW - Optical variables measurement
KW - Calculable capacitor
KW - laser alignment
DO - 10.1109/CPEM.2014.6898466
JO - 29th Conference on Precision Electromagnetic Measurements (CPEM 2014)
IS -
SN - 0589-1485
VO -
VL -
JA - 29th Conference on Precision Electromagnetic Measurements (CPEM 2014)
Y1 - 24-29 Aug. 2014
ER -
TY - CONF
TI - The implications of technology scaling on plasma-induced damage
T2 - 7th International Symposium on Plasma- and Process-Induced Damage
SP - 169
EP - 172
AU - J. Suehle
AU - K. Giapis
AU - G. Sery
AU - K. Eriguchi
AU - T. Hook
AU - K. P. Cheung
PY - 2002
KW - Annealing
KW - Diodes
KW - High K dielectric materials
KW - High-K gate dielectrics
KW - NIST
KW - Plasma devices
KW - Plasma materials processing
KW - Plasma measurements
KW - Potential energy
KW - System-on-a-chip
DO - 10.1109/PPID.2002.1042636
JO - 7th International Symposium on Plasma- and Process-Induced Damage
IS -
SN -
VO -
VL -
JA - 7th International Symposium on Plasma- and Process-Induced Damage
Y1 - 2002
ER -
TY - CONF
TI - Quality Metrics in optical modulation analysis: EVM and its relation to Q-factor, OSNR, and BER
T2 - 2012 Asia Communications and Photonics Conference (ACP)
SP - 1
EP - 3
AU - B. Nebendahl
AU - R. Schmogrow
AU - T. Dennis
AU - A. Josten
AU - D. Hillerkuss
AU - S. Koenig
AU - J. Meyer
AU - M. Dreschmann
AU - M. Winter
AU - M. Huebner
AU - W. Freude
AU - C. Koos
AU - J. Leuthold
PY - 2012
KW - Gaussian noise
KW - Q-factor
KW - error statistics
KW - forward error correction
KW - optical communication
KW - optical modulation
KW - quadrature amplitude modulation
KW - BER
KW - EVM
KW - FEC
KW - OSNR
KW - Q-factor
KW - QAM
KW - additive Gaussian noise
KW - bit error ratio
KW - error vector magnitude
KW - optical communications
KW - optical modulation analysis
KW - optical signal-to-noise power ratio
KW - quadrature amplitude modulation
KW - quality metrics
KW - soft decision forward error correction
KW - software-defined transmitter
KW - Q-factor
KW - bit-error ratio (BER)
KW - error vector magnitude (EVM)
KW - signal-to-noise power ratio
KW - software defined transmitter
DO -
JO - 2012 Asia Communications and Photonics Conference (ACP)
IS -
SN - 2162-108X
VO -
VL -
JA - 2012 Asia Communications and Photonics Conference (ACP)
Y1 - 7-10 Nov. 2012
ER -
TY - JOUR
TI - High-Throughput Screening of Amorphous – Higher Gate Dielectric Layers
T2 - IEEE Transactions on Electron Devices
SP - 3212
EP - 3216
AU - K. S. Chang
AU - M. L. Green
AU - P. K. Schenck
AU - I. Levin
AU - E. Venkatasubramanian
PY - 2012
KW - X-ray diffractometers
KW - amorphous semiconductors
KW - annealing
KW - high-k dielectric thin films
KW - permittivity
KW - pulsed laser deposition
KW - shielding
KW - transmission electron microscopy
KW - Y2O3TiO2-SiO2-Si
KW - amorphous higher dielectric constant film
KW - amorphous higher k gate dielectric layer
KW - anneal
KW - combinatorial methodology
KW - combinatorial pulsed laser deposition
KW - composition parameter space
KW - compositional spread libraries
KW - gate stacks
KW - gate-last process flow
KW - high-resolution transmission electron microscopy
KW - high-throughput screening
KW - scanning X-ray microdiffractometry
KW - temperature 500 C
KW - Dielectric constant
KW - Logic gates
KW - Pulsed laser deposition
KW - Silicon
KW - $hbox{Y}_{2}hbox{O}_{3}$– $hbox{TiO}_{2}hbox{/}hbox{SiO}_{2}$ library films
KW - Amorphous
KW - combinatorial pulsed laser deposition (PLD)
KW - higher $kappa$ dielectrics
DO - 10.1109/TED.2012.2216533
JO - IEEE Transactions on Electron Devices
IS - 12
SN - 0018-9383
VO - 59
VL - 59
JA - IEEE Transactions on Electron Devices
Y1 - Dec. 2012
ER -
TY - JOUR
TI - Verification of Noise-Parameter Measurements and Uncertainties
T2 - IEEE Transactions on Instrumentation and Measurement
SP - 3685
EP - 3693
AU - J. Randa
AU - J. Dunsmore
AU - D. Gu
AU - K. Wong
AU - D. K. Walker
AU - R. D. Pollard
PY - 2011
KW - amplifiers
KW - measurement systems
KW - noise measurement
KW - transistors
KW - amplifiers
KW - device under test
KW - mismatched transmission line
KW - noise-parameter measurements
KW - passive two-port device
KW - transistors
KW - uncertainty analysis
KW - Measurement uncertainty
KW - Noise
KW - Noise measurement
KW - Transmission line measurements
KW - Uncertainty
KW - Amplifier noise
KW - measurement uncertainties
KW - noise parameters
KW - transistor noise
KW - verification methods
DO - 10.1109/TIM.2011.2138270
JO - IEEE Transactions on Instrumentation and Measurement
IS - 11
SN - 0018-9456
VO - 60
VL - 60
JA - IEEE Transactions on Instrumentation and Measurement
Y1 - Nov. 2011
ER -
TY - JOUR
TI - Low-Ohmic Resistance Comparison: Measurement Capabilities and Resistor Traveling Behavior
T2 - IEEE Transactions on Instrumentation and Measurement
SP - 1723
EP - 1728
AU - G. Rietveld
AU - J. H. N. van der Beek
AU - M. Kraft
AU - R. E. Elmquist
AU - A. Mortara
AU - B. Jeckelmann
PY - 2013
KW - electric resistance measurement
KW - measurement uncertainty
KW - resistors
KW - low ohmic resistance measurement
KW - measurement uncertainty
KW - resistor traveling behavior
KW - Current measurement
KW - Electrical resistance measurement
KW - Laboratories
KW - NIST
KW - Resistance
KW - Resistors
KW - Temperature measurement
KW - Comparison
KW - low-ohmic measurements
KW - precision measurements
KW - resistance measurements
KW - resistors
KW - shunts
KW - traveling behavior
DO - 10.1109/TIM.2012.2225917
JO - IEEE Transactions on Instrumentation and Measurement
IS - 6
SN - 0018-9456
VO - 62
VL - 62
JA - IEEE Transactions on Instrumentation and Measurement
Y1 - June 2013
ER -
TY - CONF
TI - Broadband mid-IR fiber supercontinuum source for hyperspectral image projection
T2 - 2011 IEEE Photonics Society Summer Topical Meeting Series
SP - 93
EP - 94
AU - L. B. Shaw
AU - R. R. Gattass
AU - J. S. Sanghera
AU - I. D. Aggarwal
AU - J. P. Rice
PY - 2011
KW - image sensors
KW - optical parametric oscillators
KW - optical projectors
KW - supercontinuum generation
KW - IR sensor systems
KW - OPO sources
KW - blackbodies
KW - broadband fiber based supercontinuum mid-IR source
KW - broadband mid-IR fiber supercontinuum source
KW - globars
KW - high temperature artifacts
KW - hyperspectral image projection
KW - imaging sensors
KW - imaging systems
KW - optical parametric oscillators
KW - projection systems
KW - quantum cascade laser sources
KW - resistor arrays
KW - scene artifacts
KW - sensor testing
KW - spectral content
KW - spectral coverage
KW - spectral response
KW - wide wavelength region
KW - Hip
KW - Hyperspectral imaging
KW - Optical fiber dispersion
KW - Optical fiber sensors
KW - Quantum cascade lasers
DO - 10.1109/PHOSST.2011.6000062
JO - 2011 IEEE Photonics Society Summer Topical Meeting Series
IS -
SN - 1099-4742
VO -
VL -
JA - 2011 IEEE Photonics Society Summer Topical Meeting Series
Y1 - 18-20 July 2011
ER -
TY - JOUR
TI - Multitone Waveform Synthesis With a Quantum Voltage Noise Source
T2 - IEEE Transactions on Applied Superconductivity
SP - 681
EP - 686
AU - S. P. Benz
AU - P. D. Dresselhaus
AU - C. J. Burroughs
PY - 2011
KW - circuit noise
KW - digital-analogue conversion
KW - network synthesis
KW - noise measurement
KW - quantum noise
KW - superconducting junction devices
KW - thermometers
KW - waveform analysis
KW - JNT system
KW - Johnson noise thermometry
KW - QVNS circuit design
KW - amplitude-frequency response
KW - analog electronics
KW - digital electronics
KW - digital-analog conversion
KW - equal amplitude harmonic tone
KW - lumped-array Josephson-junction circuit
KW - multitone waveform synthesis
KW - noise measurement
KW - pulse-driven Josephson array
KW - quantum voltage noise source
KW - random relative phase
KW - unipolar bias technique
KW - voltage accuracy
KW - Coplanar waveguides
KW - Harmonic analysis
KW - Junctions
KW - Lead
KW - Noise
KW - Resistors
KW - Temperature measurement
KW - Correlation
KW - Johnson noise
KW - Josephson arrays
KW - digital–analog conversion
KW - noise measurement
KW - quantization
KW - thermometry
DO - 10.1109/TASC.2010.2083616
JO - IEEE Transactions on Applied Superconductivity
IS - 3
SN - 1051-8223
VO - 21
VL - 21
JA - IEEE Transactions on Applied Superconductivity
Y1 - June 2011
ER -
TY - JOUR
TI - Juliet 1.1 C/C++ and Java Test Suite
T2 - Computer
SP - 88
EP - 90
AU - T. Boland
AU - P. E. Black
PY - 2012
KW - C++ language
KW - Java
KW - program diagnostics
KW - software tools
KW - Java Test Suite
KW - Juliet 1.1 C/C++
KW - Juliet Test Suite 1.1
KW - software-assurance tool
KW - static analyzer
KW - Computer security
KW - Java
KW - Software testing
KW - Testing
KW - Juliet Test Suite 1.1
KW - security
KW - software testing
DO - 10.1109/MC.2012.345
JO - Computer
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VO - 45
VL - 45
JA - Computer
Y1 - Oct. 2012
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TI - The Bugs Framework (BF): A Structured Approach to Express Bugs
T2 - 2016 IEEE International Conference on Software Quality, Reliability and Security (QRS)
SP - 175
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AU - I. Bojanova
AU - P. E. Black
AU - Y. Yesha
AU - Y. Wu
PY - 2016
KW - program debugging
KW - software quality
KW - software reliability
KW - BF taxonomy
KW - buffer overflow class
KW - bug classes
KW - bugs framework
KW - digital systems
KW - dynamic properties
KW - injection class
KW - interaction frequency class
KW - software assurance tools
KW - software failures
KW - software vulnerabilities
KW - Buffer overflows
KW - Computer bugs
KW - Materials, elements, and compounds
KW - NIST
KW - Security
KW - Software
KW - Taxonomy
KW - attacks
KW - bug taxonomy
KW - software weaknesses
DO - 10.1109/QRS.2016.29
JO - 2016 IEEE International Conference on Software Quality, Reliability and Security (QRS)
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JA - 2016 IEEE International Conference on Software Quality, Reliability and Security (QRS)
Y1 - 1-3 Aug. 2016
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TY - JOUR
TI - On-Chip Temperature Distribution of Josephson Voltage Standard Devices
T2 - IEEE Transactions on Applied Superconductivity
SP - 1
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AU - A. E. Fox
AU - E. B. Golden
AU - P. D. Dresselhaus
AU - S. P. Benz
PY - 2017
KW - sapphire
KW - silicon
KW - superconducting junction devices
KW - temperature distribution
KW - temperature measurement
KW - Josephson junction array
KW - Josephson voltage standard devices
KW - heat transport
KW - interface layer
KW - junction critical current measurement
KW - microwave termination resistor
KW - national institute of standards and technology
KW - off-chip termination
KW - on-chip temperature distribution
KW - on-chip termination resistor
KW - on-chip thermometry
KW - sapphire
KW - silicon
KW - single voltage standard style array
KW - substrate surface temperature characterization
KW - thermal profile
KW - thermal properties
KW - thermal transport
KW - thermometer junction
KW - Current measurement
KW - Heating
KW - Junctions
KW - Microwave circuits
KW - Resistors
KW - Substrates
KW - Temperature measurement
KW - Josephson devices
KW - Josephson junctions
KW - superconducting device fabrication
KW - superconducting integrated circuits
DO - 10.1109/TASC.2016.2628308
JO - IEEE Transactions on Applied Superconductivity
IS - 4
SN - 1051-8223
VO - 27
VL - 27
JA - IEEE Transactions on Applied Superconductivity
Y1 - June 2017
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TY - CONF
TI - Spectral engineering of frequency combs using deposited waveguides
T2 - 2016 Conference on Lasers and Electro-Optics (CLEO)
SP - 1
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PY - 2016
KW - integrated optoelectronics
KW - optical frequency combs
KW - optical waveguides
KW - silicon compounds
KW - SiN
KW - comb-based spectroscopy
KW - deposited waveguides
KW - difference frequency generation
KW - dispersion designs
KW - frequency combs
KW - spectral engineering
KW - Dispersion
KW - Nonlinear optics
KW - Optical device fabrication
KW - Optical waveguides
KW - Silicon compounds
KW - Spectroscopy
KW - Waveguide lasers
DO -
JO - 2016 Conference on Lasers and Electro-Optics (CLEO)
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SN -
VO -
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JA - 2016 Conference on Lasers and Electro-Optics (CLEO)
Y1 - 5-10 June 2016
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TY - CONF
TI - The turbulent characteristics of the radio refractive index near the ground
T2 - 1963 Antennas and Propagation Society International Symposium
SP - 62
EP - 64
AU - B. Bean
AU - R. McGavin
PY - 1963
KW - Atmosphere
KW - Frequency
KW - Heat transfer
KW - Humidity
KW - Mechanical energy
KW - Production
KW - Refractive index
KW - Stability
KW - Thermal force
KW - Wind speed
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JO - 1963 Antennas and Propagation Society International Symposium
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SN -
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JA - 1963 Antennas and Propagation Society International Symposium
Y1 - Jul 1963
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TI - The NBS-LASL CW Microtron
T2 - IEEE Transactions on Nuclear Science
SP - 1526
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AU - S. Penner
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PY - 1981
KW - Acceleration
KW - Buildings
KW - Electron accelerators
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KW - Linear particle accelerator
KW - NIST
KW - Particle beam measurements
KW - Particle beams
KW - Testing
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JO - IEEE Transactions on Nuclear Science
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TI - Magnetic barrier structures for superconductingmagnetic hybrid Josephson junctions
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SP - 1
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AU - B. Baek
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KW - critical currents
KW - cryogenics
KW - ferromagnetic materials
KW - lead compounds
KW - magnetic hysteresis
KW - magnetic switching
KW - magnetoelectronics
KW - manganese
KW - nickel compounds
KW - niobium
KW - silicon
KW - spin valves
KW - superconducting junction devices
KW - superconducting memory circuits
KW - Josephson coupling
KW - Nb
KW - NiFeNb
KW - PSV
KW - PdFe
KW - Si:Mn
KW - critical current
KW - cryogenic memory
KW - magnetic barrier structures
KW - magnetic clusters
KW - magnetic hysteresis
KW - magnetic switching behavior
KW - magnetization measurements
KW - pseudospin valves
KW - single-flux quantum pulses
KW - spintronic technology
KW - superconducting-magnetic hybrid Josephson junctions
KW - temperature 10 K
KW - Josephson junctions
KW - Junctions
KW - Magnetic hysteresis
KW - Magnetic tunneling
KW - Nickel
KW - Niobium
KW - Superconducting magnets
KW - Josephson junction
KW - cryogenic memory
KW - spin valve
KW - spintronics
KW - superconducting electronics
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JO - 2013 IEEE 14th International Superconductive Electronics Conference (ISEC)
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TI - Some information theory aspects of propagation through time varying media
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PY - 1954
KW - Channel capacity
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KW - Fading
KW - Fluctuations
KW - Gaussian noise
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KW - Noise reduction
KW - Probability distribution
KW - Rayleigh channels
KW - White noise
DO - 10.1109/IRECON.1954.1150183
JO - 1958 IRE International Convention Record
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SN -
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Y1 - 21-25 March 1966
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TI - PTB-NIST bilateral comparison of microwave noise power in coaxial transmission line
T2 - IEEE Transactions on Instrumentation and Measurement
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AU - D. F. Wait
AU - G. J. Counas
AU - W. Kessel
AU - F. M. Buchholz
PY - 1991
KW - Coaxial components
KW - Electromagnetic waveguides
KW - Laboratories
KW - NIST
KW - Noise generators
KW - Power transmission lines
KW - Radio frequency
KW - Radiometers
KW - Standards development
KW - Thermal resistance
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JO - IEEE Transactions on Instrumentation and Measurement
IS - 2
SN - 0018-9456
VO - 40
VL - 40
JA - IEEE Transactions on Instrumentation and Measurement
Y1 - Apr 1991
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TI - A Framework for Broadband Characterization of Individual Nanowires
T2 - IEEE Microwave and Wireless Components Letters
SP - 178
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AU - P. Rice
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PY - 2010
KW - contact resistance
KW - coplanar waveguide components
KW - finite element analysis
KW - nanowires
KW - broadband characterization
KW - contact resistance
KW - coplanar waveguide devices
KW - finite element modeling
KW - individual nanowires
KW - on-wafer multiline thru-reflect-line measurements
KW - Conductivity
KW - contact resistance
KW - coplanar waveguide (CPW)
KW - nanowires
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JO - IEEE Microwave and Wireless Components Letters
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JA - IEEE Microwave and Wireless Components Letters
Y1 - March 2010
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TI - Pixel Interlacing Based Video Transmission for Low-Complexity Intra-Frame Error Concealment
T2 - IEEE Transactions on Broadcasting
SP - 253
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AU - B. Yan
AU - H. Gharavi
AU - B. Hu
PY - 2011
KW - fading channels
KW - mobile radio
KW - video coding
KW - compressed video signal
KW - error prone mobile networks
KW - interference frequently
KW - low complexity intra frame error concealment
KW - mobile radio communication system
KW - multipath fading
KW - pixel interlacing
KW - severe channel condition
KW - video transmission
KW - Automatic voltage control
KW - Encoding
KW - Image quality
KW - Interpolation
KW - PSNR
KW - Pixel
KW - Streaming media
KW - Error concealment
KW - H.264/AVC
KW - sub-band coding
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JO - IEEE Transactions on Broadcasting
IS - 2
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JA - IEEE Transactions on Broadcasting
Y1 - June 2011
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TI - Efficient optical generation of large-amplitude Schrödinger cat states with minimal resources
T2 - 2015 Conference on Lasers and Electro-Optics (CLEO)
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AU - J. Ruaudel
AU - V. B. Verma
AU - M. D. Shaw
AU - F. Marsili
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AU - H. Zeng
AU - Y. C. Jeong
AU - R. Filip
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KW - Schrodinger equation
KW - light coherence
KW - core nonGaussian state
KW - expensive nonGaussian resources
KW - large coherent state superposition generation
KW - large-amplitude Schrödinger cat states
KW - minimal resources
KW - optical generation
KW - unprecedented preparation rate
KW - Adaptive optics
KW - Cascading style sheets
KW - Optical mixing
KW - Optical pumping
KW - Photonics
KW - Protocols
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JO - 2015 Conference on Lasers and Electro-Optics (CLEO)
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Y1 - 10-15 May 2015
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TI - Electron Radiation Damage Effects in Silicon Surface-Barrier Detectors
T2 - IEEE Transactions on Nuclear Science
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PY - 1971
KW - Aluminum
KW - Capacitance
KW - Degradation
KW - Electrons
KW - Gold
KW - Leak detection
KW - Leakage current
KW - Radiation detectors
KW - Silicon radiation detectors
KW - Temperature distribution
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JO - IEEE Transactions on Nuclear Science
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JA - IEEE Transactions on Nuclear Science
Y1 - Feb. 1971
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TI - The characteristics of iris fed millimeter-wave rectangular microstrip patch antennas
T2 - 1982 Antennas and Propagation Society International Symposium
SP - 292
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AU - M. Kanda
AU - D. Chang
AU - C. Greenlee
PY - 1982
KW - Antenna feeds
KW - Apertures
KW - Impedance
KW - Iris
KW - Microstrip antennas
KW - Microwave frequencies
KW - Patch antennas
KW - Resonance
KW - Resonant frequency
KW - Shunt (electrical)
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JO - 1982 Antennas and Propagation Society International Symposium
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JA - 1982 Antennas and Propagation Society International Symposium
Y1 - 24-28 May 1982
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TI - A theory for imaging with transmission near-field optical microscopy
T2 - Lasers and Electro-Optics, 1997. CLEO '97., Summaries of Papers Presented at the Conference on
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AU - E. L. Shirley
AU - L. S. Goldner
PY - 1997
KW - Capacitive sensors
KW - Crystals
KW - Electron optics
KW - Excitons
KW - Gallium
KW - Nonlinear optics
KW - Optical harmonic generation
KW - Optical imaging
KW - Optical microscopy
KW - Tensile strain
DO - 10.1109/CLEO.1997.603087
JO - Lasers and Electro-Optics, 1997. CLEO '97., Summaries of Papers Presented at the Conference on
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JA - Lasers and Electro-Optics, 1997. CLEO '97., Summaries of Papers Presented at the Conference on
Y1 - 18-23 May 1997
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TI - A receiver for the Lunar Laser Communication Demonstration using the optical communications telescope laboratory
T2 - 2014 Conference on Lasers and Electro-Optics (CLEO) - Laser Science to Photonic Applications
SP - 1
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AU - K. Birnbaum
AU - M. Cheng
AU - M. Srinivasan
AU - K. Quirk
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AU - F. Marsili
AU - V. B. Verma
AU - R. P. Mirin
AU - S. W. Nam
AU - J. A. Stern
AU - W. H. Farr
PY - 2014
KW - astronomical telescopes
KW - nanowires
KW - superconducting photodetectors
KW - lunar laser communication
KW - optical communications telescope laboratory
KW - software communication link
KW - tungsten silicide superconducting nanowire single photon detectors
KW - Arrays
KW - Assembly
KW - Detectors
KW - Moon
KW - Optical fiber communication
KW - Optical fibers
KW - Receivers
DO - 10.1364/CLEO_SI.2014.SM4J.2
JO - 2014 Conference on Lasers and Electro-Optics (CLEO) - Laser Science to Photonic Applications
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Y1 - 8-13 June 2014
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TI - Does Security Trump Reliability?
T2 - Computer
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AU - J. M. Voas
PY - 2013
KW - Internet
KW - Network security
KW - Reliability
KW - Security
KW - Trust management
KW - Internet
KW - reliability
KW - security
KW - trust
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Y1 - Nov. 2013
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TI - Efficient and low noise frequency downconversion from the 980 nm band to the 1550 nm band using Si3N4 microrings
T2 - 2016 Conference on Lasers and Electro-Optics (CLEO)
SP - 1
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AU - M. Davanco
AU - K. Srinivasan
PY - 2016
KW - light scattering
KW - micro-optics
KW - multiwave mixing
KW - optical frequency conversion
KW - optical noise
KW - optical pumping
KW - silicon compounds
KW - Si3N4
KW - continuous wave pump power
KW - four-wave-mixing Bragg scattering
KW - low noise frequency downconversion
KW - microrings
KW - pW-level background noise power
KW - wavelength 980 nm to 1550 nm
DO -
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Y1 - 5-10 June 2016
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TI - Heralded single photons from a silicon nanophotonic chip
T2 - 2012 Conference on Lasers and Electro-Optics (CLEO)
SP - 1
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AU - J. R. Ong
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AU - A. B. Shehata
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AU - K. Srinivasan
AU - S. Mookherjea
PY - 2012
KW - integrated optics
KW - nanophotonics
KW - optical couplers
KW - optical resonators
KW - optical waveguides
KW - silicon
KW - Si
KW - coincidences-to-accidentals ratio
KW - highly nonlinear silicon coupled-resonator-optical-waveguide
KW - photon pairs
KW - silicon nanophotonic chip
KW - single photons
KW - Band pass filters
KW - Optical fiber filters
KW - Optical resonators
KW - Optical waveguides
KW - Photonics
KW - Resonator filters
KW - Silicon
DO - 10.1364/CLEO_SI.2012.CTh3M.6
JO - 2012 Conference on Lasers and Electro-Optics (CLEO)
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Y1 - 6-11 May 2012
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TI - Measurement of space charge fields in polymers
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KW - Charge measurement
KW - Electric fields
KW - Electrodes
KW - Plastics
KW - Pulse measurements
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TI - An Architecture To Support Autonomy, Teleoperation, And Shared Control
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KW - Communication system control
KW - Computer architecture
KW - Control systems
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KW - Force control
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KW - Humans
KW - Information filtering
KW - Sensor systems
KW - Servomechanisms
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TI - Characteristics of the Ionosphere at Washington, D.C., June, 1939
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KW - Frequency
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KW - Observatories
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KW - US Department of Commerce
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TI - A delta-distribution derivation of the electric field in the source region
T2 - 1981 Antennas and Propagation Society International Symposium
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PY - 1981
KW - Calculus
KW - Current density
KW - Electromagnetic fields
KW - Equations
KW - Government
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KW - Polarization
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TI - A new metrology for tissue engineering: collinear optical coherence and confocal fluorescence microscopies
T2 - Lasers and Electro-Optics, 2003. CLEO '03. Conference on
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KW - Biological tissues
KW - Fluorescence
KW - Metrology
KW - Mineralization
KW - Optical microscopy
KW - Optical polymers
KW - Reflectivity
KW - Solids
KW - Tissue engineering
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TI - Optically strobed sampling oscilloscope
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KW - photoconductive cells
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KW - Cr-doped GaAs photoconductor
KW - GaAs laser diode
KW - commercial sampling oscilloscope
KW - optically strobed sampling oscilloscope
KW - photoconductor sampling gate
KW - Adaptive optics
KW - Gallium arsenide
KW - Logic gates
KW - Optical distortion
KW - Optical pulses
KW - Oscilloscopes
KW - Resistors
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KW - data compression
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KW - mission planning
KW - motion imagery
KW - peak SNR
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KW - structural similarity
KW - systems architecture
KW - video compression
KW - Bit rate
KW - Image analysis
KW - Image coding
KW - Image motion analysis
KW - Image quality
KW - Measurement standards
KW - Motion analysis
KW - Motion measurement
KW - Transform coding
KW - Video compression
KW - NIIRS
KW - compression
KW - image interpretability
KW - motion imagery
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KW - Arresters
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KW - Insulation
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KW - Standards
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KW - Airplanes
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KW - Receiving antennas
KW - Standards development
KW - Telephony
KW - US Department of Commerce
DO - 10.1109/JRPROC.1928.221490
JO - Proceedings of the Institute of Radio Engineers
IS - 7
SN - 0731-5996
VO - 16
VL - 16
JA - Proceedings of the Institute of Radio Engineers
Y1 - July 1928
ER -
TY - JOUR
TI - The two-stage current transformer
T2 - Journal of the American Institute of Electrical Engineers
SP - 389
EP - 398
AU - H. B. Brooks
AU - F. C. Holtz
PY - 1922
KW - Accuracy
KW - Current transformers
KW - Reactive power
KW - Transformer cores
KW - Watthour meters
KW - Windings
DO - 10.1109/JoAIEE.1922.6592459
JO - Journal of the American Institute of Electrical Engineers
IS - 6
SN - 0360-6449
VO - 41
VL - 41
JA - Journal of the American Institute of Electrical Engineers
Y1 - June 1922
ER -
TY - JOUR
TI - Widely Separated Clocks with Microsecond Synchronization and Independent Distribution Systems
T2 - IRE Transactions on Space Electronics and Telemetry
SP - 138
EP - 146
AU - T. L. Davis
AU - R. H. Doherty
PY - 1960
KW - Clocks
KW - Frequency synchronization
KW - Master-slave
KW - Monitoring
KW - Navigation
KW - Pulse shaping methods
KW - Sampling methods
KW - Senior members
KW - Shape
KW - Timing
DO - 10.1109/IRET-SET.1960.5008733
JO - IRE Transactions on Space Electronics and Telemetry
IS - 3-4
SN - 0096-252X
VO - SET-6
VL - SET-6
JA - IRE Transactions on Space Electronics and Telemetry
Y1 - September-December 1960
ER -
TY - JOUR
TI - Characteristics of the Ionosphere at Washington, D.C., September, 1937
T2 - Proceedings of the Institute of Radio Engineers
SP - 1493
EP - 1496
AU - T. R. Gilliland
AU - S. S. Kirby
AU - N. Smith
AU - S. E. Reymer
PY - 1937
KW - Frequency
KW - Hafnium
KW - Ionosphere
KW - NIST
KW - Reflection
KW - Storms
KW - US Department of Commerce
DO - 10.1109/JRPROC.1937.228766
JO - Proceedings of the Institute of Radio Engineers
IS - 11
SN - 0731-5996
VO - 25
VL - 25
JA - Proceedings of the Institute of Radio Engineers
Y1 - Nov. 1937
ER -
TY - CONF
TI - Broadband measurements of nanofiber devices: Repeatability and random error analysis
T2 - 2010 76th ARFTG Microwave Measurement Conference
SP - 1
EP - 6
AU - T. M. Wallis
AU - A. Imtiaz
AU - S. H. Lim
AU - P. Kabos
AU - K. Kim
AU - P. Rice
AU - D. Filipovic
PY - 2010
KW - coplanar waveguides
KW - error analysis
KW - microwave measurement
KW - broadband measurement
KW - circuit model parameter
KW - coplanar waveguide
KW - nanofiber device
KW - nanowire device
KW - on-wafer calibration
KW - random error analysis
KW - repeatability
KW - Calibration
KW - Microwave measurements
KW - Nanotechnology
KW - Nanowires
KW - On-wafer devices
DO - 10.1109/ARFTG76.2010.5700058
JO - 2010 76th ARFTG Microwave Measurement Conference
IS -
SN -
VO -
VL -
JA - 2010 76th ARFTG Microwave Measurement Conference
Y1 - Nov. 30 2010-Dec. 3 2010
ER -
TY - JOUR
TI - A Source of Error in the Measurement of Radiated Harmonics
T2 - Proceedings of the IRE
SP - 486
EP - 487
AU - F. M. Greene
PY - 1952
KW - Attenuation measurement
KW - Attenuators
KW - Frequency conversion
KW - Frequency measurement
KW - Power harmonic filters
KW - Radio frequency
KW - Testing
KW - Tuned circuits
KW - VHF circuits
KW - Voltage
DO - 10.1109/JRPROC.1952.274048
JO - Proceedings of the IRE
IS - 4
SN - 0096-8390
VO - 40
VL - 40
JA - Proceedings of the IRE
Y1 - April 1952
ER -
TY - CONF
TI - Near-field spherical scanning: Quiet-zone field evaluation
T2 - 2009 IEEE Antennas and Propagation Society International Symposium
SP - 1
EP - 4
AU - R. H. Direen
AU - M. H. Francis
AU - R. C. Wittmann
PY - 2009
KW - anechoic chambers (electromagnetic)
KW - antenna radiation patterns
KW - electromagnetic fields
KW - scanning antennas
KW - anechoic chamber evaluation
KW - antenna radiation
KW - compact-range performance evaluation
KW - near-electromagnetic-field interior spherical scanning method
KW - quiet test-zone field evaluation
KW - Antenna measurements
KW - Displacement measurement
KW - Electric variables measurement
KW - Government
KW - Magnetic field measurement
KW - NIST
KW - Performance evaluation
KW - Position measurement
KW - Probes
KW - Testing
DO - 10.1109/APS.2009.5171901
JO - 2009 IEEE Antennas and Propagation Society International Symposium
IS -
SN - 1522-3965
VO -
VL -
JA - 2009 IEEE Antennas and Propagation Society International Symposium
Y1 - 1-5 June 2009
ER -
TY - JOUR
TI - Precise measurement and the race for technological supremacy
T2 - Electrical Engineering
SP - 294
EP - 296
AU - A. V. Astin
PY - 1958
KW - Calibration
KW - Industries
KW - Instruments
KW - Laboratories
KW - Measurement standards
KW - NIST
DO - 10.1109/EE.1958.6445008
JO - Electrical Engineering
IS - 4
SN - 0095-9197
VO - 77
VL - 77
JA - Electrical Engineering
Y1 - April 1958
ER -
TY - JOUR
TI - Differential Sampling Measurement of a 7 V RMS Sine Wave With a Programmable Josephson Voltage Standard
T2 - IEEE Transactions on Instrumentation and Measurement
SP - 1587
EP - 1593
AU - A. Rüfenacht
AU - C. J. Burroughs
AU - P. D. Dresselhaus
AU - S. P. Benz
PY - 2013
KW - calibration
KW - least mean squares methods
KW - measurement standards
KW - measurement uncertainty
KW - signal sampling
KW - superconducting junction devices
KW - voltage measurement
KW - AC voltage mode
KW - RMS
KW - calibration
KW - commercial calibrator
KW - differential sampling measurement
KW - frequency 62.5 Hz
KW - measurement uncertainty
KW - programmable Josephson voltage standard
KW - sine wave
KW - voltage 10 V
KW - voltage 7 V
KW - voltage measurement
KW - Apertures
KW - Measurement uncertainty
KW - Sampling methods
KW - Standards
KW - Uncertainty
KW - Voltage measurement
KW - Voltmeters
KW - Analog-digital conversion
KW - Josephson arrays
KW - power measurement
KW - quantization
KW - signal synthesis
KW - standards
KW - superconductor–normal–superconductor devices
KW - voltage measurement
DO - 10.1109/TIM.2013.2237993
JO - IEEE Transactions on Instrumentation and Measurement
IS - 6
SN - 0018-9456
VO - 62
VL - 62
JA - IEEE Transactions on Instrumentation and Measurement
Y1 - June 2013
ER -
TY - JOUR
TI - Obtaining the Internal Junction Characteristics of a Transistor for Use in Analog Simulation
T2 - IRE Transactions on Electronic Computers
SP - 709
EP - 710
AU - S. B. Geller
PY - 1962
KW - Analog computers
KW - Bistable circuits
KW - Capacitance
KW - Circuit simulation
KW - Diodes
KW - Feedback circuits
KW - Pulse circuits
KW - Resistors
KW - Switching circuits
KW - Voltage
DO - 10.1109/TEC.1962.5219438
JO - IRE Transactions on Electronic Computers
IS - 5
SN - 0367-9950
VO - EC-11
VL - EC-11
JA - IRE Transactions on Electronic Computers
Y1 - Oct. 1962
ER -
TY - JOUR
TI - Radio propagation by reflection from meteor trails
T2 - Proceedings of the IEEE
SP - 116
EP - 136
AU - G. R. Sugar
PY - 1964
KW - Atmosphere
KW - Frequency
KW - Ionization
KW - Laboratories
KW - Particle scattering
KW - RF signals
KW - Radio broadcasting
KW - Radio communication
KW - Radio propagation
KW - Reflection
DO - 10.1109/PROC.1964.2801
JO - Proceedings of the IEEE
IS - 2
SN - 0018-9219
VO - 52
VL - 52
JA - Proceedings of the IEEE
Y1 - Feb. 1964
ER -
TY - CONF
TI - Extended source interferometry in the compact regime
T2 - 2016 European Frequency and Time Forum (EFTF)
SP - 1
EP - 4
AU - B. Pelle
AU - G. W. Hoth
AU - S. Riedl
AU - J. Kitching
AU - E. A. Donley
PY - 2016
KW - laser cooling
KW - light interferometers
KW - light interferometry
KW - atom interferometer
KW - extended source interferometry
KW - laser-cooled atom
KW - point-source limit
KW - scale factor deviation
KW - Acceleration
KW - Atomic beams
KW - Atomic measurements
KW - Clouds
KW - Interferometry
KW - Phase measurement
KW - Rotation measurement
KW - Atomic gravimeter
KW - Point Source Interferometry
KW - atomic gyroscope
KW - compact inertial sensor
KW - scale factor bias
DO - 10.1109/EFTF.2016.7477764
JO - 2016 European Frequency and Time Forum (EFTF)
IS -
SN -
VO -
VL -
JA - 2016 European Frequency and Time Forum (EFTF)
Y1 - 4-7 April 2016
ER -
TY - JOUR
TI - The nucleus — Its structure and reactions
T2 - Electrical Engineering
SP - 125
EP - 134
AU - W. E. Shoupp
AU - H. Odishaw
PY - 1948
KW - Atomic measurements
KW - Chemicals
KW - Isotopes
KW - Neutrino sources
KW - Neutrons
KW - Positrons
KW - Protons
DO - 10.1109/EE.1948.6443961
JO - Electrical Engineering
IS - 2
SN - 0095-9197
VO - 67
VL - 67
JA - Electrical Engineering
Y1 - Feb. 1948
ER -
TY - JOUR
TI - Neighboring-patch integrals in transient electromagnetic scattering
T2 - IEEE Transactions on Antennas and Propagation
SP - 768
EP - 773
AU - E. Marx
PY - 1985
KW - Electromagnetic transient scattering
KW - Integral equations
KW - Transient electromagnetic scattering
KW - Conductors
KW - Electromagnetic fields
KW - Electromagnetic scattering
KW - Electromagnetic transients
KW - Integral equations
KW - Magnetic fields
KW - NIST
KW - Nearest neighbor searches
KW - Steady-state
KW - Surface treatment
DO - 10.1109/TAP.1985.1143658
JO - IEEE Transactions on Antennas and Propagation
IS - 7
SN - 0018-926X
VO - 33
VL - 33
JA - IEEE Transactions on Antennas and Propagation
Y1 - Jul 1985
ER -
TY - CONF
TI - Plane-radial scanning techniques with probe correction: Natural orthogonalities with respect to summation on planar measurement lattices
T2 - 1979 Antennas and Propagation Society International Symposium
SP - 561
EP - 564
AU - P. Wacker
PY - 1979
KW - Acoustic transducers
KW - Antenna measurements
KW - Data processing
KW - Differential equations
KW - Jacobian matrices
KW - Lattices
KW - NIST
KW - Polynomials
KW - Probes
KW - Rotation measurement
DO - 10.1109/APS.1979.1148037
JO - 1979 Antennas and Propagation Society International Symposium
IS -
SN -
VO - 17
VL - 17
JA - 1979 Antennas and Propagation Society International Symposium
Y1 - 18-22 June 1979
ER -
TY - JOUR
TI - A low-loss sliding short of limited travel for precision coaxial transmission lines
T2 - Proceedings of the IEEE
SP - 2188
EP - 2188
AU - N. V. Frederick
PY - 1968
KW - Coaxial components
KW - Conductors
KW - Interference
KW - Length measurement
KW - Propagation losses
KW - Reflection
KW - Silver
KW - Testing
KW - Transmission lines
KW - Yarn
DO - 10.1109/PROC.1968.6850
JO - Proceedings of the IEEE
IS - 12
SN - 0018-9219
VO - 56
VL - 56
JA - Proceedings of the IEEE
Y1 - Dec. 1968
ER -
TY - JOUR
TI - New high-voltage laboratory of the Bureau of standards
T2 - Electrical Engineering
SP - 238
EP - 240
AU - F. B. Silsbee
PY - 1940
KW - Buildings
KW - Laboratories
KW - Oil insulation
KW - Power transformer insulation
KW - Standards
KW - Voltage measurement
DO - 10.1109/EE.1940.6434944
JO - Electrical Engineering
IS - 6
SN - 0095-9197
VO - 59
VL - 59
JA - Electrical Engineering
Y1 - June 1940
ER -
TY - JOUR
TI - Noise Investigation at VLF by the National Bureau of Standards
T2 - Proceedings of the IRE
SP - 778
EP - 782
AU - W. Q. Crichlow
PY - 1957
KW - Assembly
KW - Circuit noise
KW - Frequency
KW - Geophysical measurements
KW - Manufacturing
KW - NIST
KW - Noise figure
KW - Noise level
KW - Noise measurement
KW - Radio propagation
DO - 10.1109/JRPROC.1957.278474
JO - Proceedings of the IRE
IS - 6
SN - 0096-8390
VO - 45
VL - 45
JA - Proceedings of the IRE
Y1 - June 1957
ER -