TY  - CONF
TI  - Many-body interactions between excitons in GaAs quantum wells quantified using two-dimensional coherent spectroscopy
T2  - 2015 Conference on Lasers and Electro-Optics (CLEO)
SP  - 1
EP  - 2
AU  - R. Singh
AU  - T. M. Autry
AU  - G. Moody
AU  - G. Nardin
AU  - B. Sun
AU  - T. Suzuki
AU  - S. T. Cundiff
PY  - 2015
KW  - III-V semiconductors
KW  - excitons
KW  - gallium arsenide
KW  - harmonic oscillators
KW  - many-body problems
KW  - semiconductor quantum wells
KW  - two-dimensional spectra
KW  - GaAs
KW  - GaAs quantum wells
KW  - anharmonic oscillator model
KW  - excitons
KW  - intermode interaction energies
KW  - intramode interaction energies
KW  - many-body interactions
KW  - two-dimensional coherent spectroscopy
KW  - Excitons
KW  - Optical polarization
KW  - Oscillators
KW  - Photonics
KW  - Polarization
KW  - Semiconductor device modeling
KW  - Spectroscopy
DO  - 10.1364/CLEO_AT.2015.JW2A.49
JO  - 2015 Conference on Lasers and Electro-Optics (CLEO)
IS  - 
SN  - 2160-8989
VO  - 
VL  - 
JA  - 2015 Conference on Lasers and Electro-Optics (CLEO)
Y1  - 10-15 May 2015
ER  - 

TY  - JOUR
TI  - The effect of field orientation on current transfer in multifilamentary superconductors
T2  - IEEE Transactions on Magnetics
SP  - 244
EP  - 247
AU  - L. Goodrich
PY  - 1983
KW  - Superconducting materials
KW  - Conductors
KW  - Critical current
KW  - Critical current density
KW  - Current distribution
KW  - Magnetic field measurement
KW  - Magnetic fields
KW  - Multifilamentary superconductors
KW  - Superconducting coils
KW  - Superconducting magnets
KW  - Voltage
DO  - 10.1109/TMAG.1983.1062361
JO  - IEEE Transactions on Magnetics
IS  - 3
SN  - 0018-9464
VO  - 19
VL  - 19
JA  - IEEE Transactions on Magnetics
Y1  - May 1983
ER  - 

TY  - JOUR
TI  - Tables of North Atlantic Radio Transmission Conditions for Long-Wave Daylight Signals for the Years 1922-1930
T2  - Proceedings of the Institute of Radio Engineers
SP  - 689
EP  - 698
AU  - L. W. Austin
PY  - 1932
DO  - 10.1109/JRPROC.1932.227619
JO  - Proceedings of the Institute of Radio Engineers
IS  - 4
SN  - 0731-5996
VO  - 20
VL  - 20
JA  - Proceedings of the Institute of Radio Engineers
Y1  - April 1932
ER  - 

TY  - CONF
TI  - Symbolic Road Perception-based Autonomous Driving in Urban Environments
T2  - 35th IEEE Applied Imagery and Pattern Recognition Workshop (AIPR'06)
SP  - 12
EP  - 12
AU  - M. Foedisch
AU  - R. Madhavan
AU  - C. Schlenoff
PY  - 2006
KW  - feature extraction
KW  - image recognition
KW  - mobile robots
KW  - road vehicles
KW  - roads
KW  - tree searching
KW  - autonomous driving
KW  - feature extraction
KW  - road detection
KW  - symbolic knowledge
KW  - symbolic road perception
KW  - symbolic road recognition
KW  - tree search
KW  - Data mining
KW  - Feature extraction
KW  - Image edge detection
KW  - Image reconstruction
KW  - NIST
KW  - Navigation
KW  - Road vehicles
KW  - Skeleton
KW  - Solid modeling
KW  - US Government
DO  - 10.1109/AIPR.2006.38
JO  - 35th IEEE Applied Imagery and Pattern Recognition Workshop (AIPR'06)
IS  - 
SN  - 1550-5219
VO  - 
VL  - 
JA  - 35th IEEE Applied Imagery and Pattern Recognition Workshop (AIPR'06)
Y1  - 11-13 Oct. 2006
ER  - 

TY  - CONF
TI  - An experimental study of interference impacts on ZigBee-based wireless communication inside buildings
T2  - 2010 IEEE International Conference on Mechatronics and Automation
SP  - 1982
EP  - 1987
AU  - W. Guo
AU  - W. M. Healy
AU  - M. Zhou
PY  - 2010
KW  - Bluetooth
KW  - frequency allocation
KW  - indoor radio
KW  - microwave ovens
KW  - radiofrequency interference
KW  - wireless LAN
KW  - wireless sensor networks
KW  - BlueTooth
KW  - IEEE 802.15.4 physical radio specification
KW  - WiFi
KW  - ZigBee-based wireless communication inside building
KW  - collocated network
KW  - frequency 2.4 GHz
KW  - interference prediction algorithm
KW  - low-power wireless sensor networks
KW  - microwave oven
KW  - network designer
KW  - packet error rate
KW  - radio spectrum
KW  - IEEE 802.11 Standards
KW  - Interference
KW  - Microwave communication
KW  - Microwave ovens
KW  - Ovens
KW  - Receivers
KW  - Zigbee
DO  - 10.1109/ICMA.2010.5589256
JO  - 2010 IEEE International Conference on Mechatronics and Automation
IS  - 
SN  - 2152-7431
VO  - 
VL  - 
JA  - 2010 IEEE International Conference on Mechatronics and Automation
Y1  - 4-7 Aug. 2010
ER  - 

TY  - JOUR
TI  - Accurate radio-frequency microvoltages
T2  - Transactions of the American Institute of Electrical Engineers, Part I: Communication and Electronics
SP  - 158
EP  - 164
AU  - M. C. Selby
PY  - 1953
KW  - Conductors
KW  - Films
KW  - Finite element methods
KW  - Impedance
KW  - Inductance
KW  - Monitoring
KW  - Resistance
DO  - 10.1109/TCE.1953.6371991
JO  - Transactions of the American Institute of Electrical Engineers, Part I: Communication and Electronics
IS  - 2
SN  - 0097-2452
VO  - 72
VL  - 72
JA  - Transactions of the American Institute of Electrical Engineers, Part I: Communication and Electronics
Y1  - May 1953
ER  - 

TY  - CONF
TI  - Self-Deployment Algorithms for Coverage Problem in a Network of Mobile Sensors with Unidentical Sensing Ranges
T2  - 2010 IEEE Global Telecommunications Conference GLOBECOM 2010
SP  - 1
EP  - 6
AU  - H. Mahboubi
AU  - K. Moezzi
AU  - A. G. Aghdam
AU  - K. Sayrafian-Pour
AU  - V. Marbukh
PY  - 2010
KW  - computational geometry
KW  - sensor placement
KW  - wireless sensor networks
KW  - Voronoi diagram
KW  - coverage problem
KW  - mobile sensors network
KW  - self-deployment algorithms
KW  - unidentical sensing ranges
KW  - Bismuth
KW  - IEEE Communications Society
KW  - Mobile communication
KW  - Peer to peer computing
KW  - Sensor phenomena and characterization
KW  - Silicon
DO  - 10.1109/GLOCOM.2010.5683204
JO  - 2010 IEEE Global Telecommunications Conference GLOBECOM 2010
IS  - 
SN  - 1930-529X
VO  - 
VL  - 
JA  - 2010 IEEE Global Telecommunications Conference GLOBECOM 2010
Y1  - 6-10 Dec. 2010
ER  - 

TY  - CONF
TI  - A comparison of GPS common-view time transfer to all-in-view
T2  - Proceedings of the 2005 IEEE International Frequency Control Symposium and Exposition, 2005.
SP  - 5 pp.
EP  - 
AU  - M. A. Weiss
AU  - G. Petit
AU  - Z. Jiang
PY  - 2005
KW  - Global Positioning System
KW  - atomic clocks
KW  - phase noise
KW  - time measurement
KW  - white noise
KW  - 1 d
KW  - 100 ps
KW  - 13 min
KW  - 2 ns
KW  - 3 d
KW  - 300 ps
KW  - GPS
KW  - all-in-view time transfer
KW  - common-view time transfer
KW  - ephemeris estimate
KW  - flicker phase noise
KW  - ionosphere-free time transfer data
KW  - ionospheric maps
KW  - multi-path interference
KW  - satellite clock estimate
KW  - white phase noise
KW  - 1f noise
KW  - Clocks
KW  - Dispersion
KW  - Europe
KW  - Global Positioning System
KW  - Interference
KW  - North America
KW  - Phase noise
KW  - Satellites
KW  - Stability
DO  - 10.1109/FREQ.2005.1573953
JO  - Proceedings of the 2005 IEEE International Frequency Control Symposium and Exposition, 2005.
IS  - 
SN  - 2327-1914
VO  - 
VL  - 
JA  - Proceedings of the 2005 IEEE International Frequency Control Symposium and Exposition, 2005.
Y1  - 29-31 Aug. 2005
ER  - 

TY  - JOUR
TI  - Measured Statistical Characteristics of VLF Atmospheric Radio Noise
T2  - Proceedings of the IRE
SP  - 55
EP  - 62
AU  - A. D. Watt
AU  - E. L. Maxwell
PY  - 1957
KW  - Arctic
KW  - Atmospheric measurements
KW  - Bandwidth
KW  - Dynamic range
KW  - Instruments
KW  - Noise level
KW  - Noise measurement
KW  - Pulse measurements
KW  - Signal to noise ratio
KW  - Time measurement
DO  - 10.1109/JRPROC.1957.278256
JO  - Proceedings of the IRE
IS  - 1
SN  - 0096-8390
VO  - 45
VL  - 45
JA  - Proceedings of the IRE
Y1  - Jan. 1957
ER  - 

TY  - JOUR
TI  - Laser-beam system for the measurement of mean transverse wind
T2  - IEEE Journal of Quantum Electronics
SP  - 274
EP  - 274
AU  - G. Ochs
AU  - S. Clifford
AU  - R. Lawrence
PY  - 1971
KW  - Absorption
KW  - Distortion measurement
KW  - Electron beams
KW  - Laser beams
KW  - Laser noise
KW  - Power lasers
DO  - 10.1109/JQE.1971.1076730
JO  - IEEE Journal of Quantum Electronics
IS  - 6
SN  - 0018-9197
VO  - 7
VL  - 7
JA  - IEEE Journal of Quantum Electronics
Y1  - June 1971
ER  - 

TY  - JOUR
TI  - A Semantic Product Modeling Framework and Its Application to Behavior Evaluation
T2  - IEEE Transactions on Automation Science and Engineering
SP  - 110
EP  - 123
AU  - J. H. Lee
AU  - S. J. Fenves
AU  - C. Bock
AU  - H. W. Suh
AU  - S. Rachuri
AU  - X. Fiorentini
AU  - R. D. Sriram
PY  - 2012
KW  - CAD
KW  - ontologies (artificial intelligence)
KW  - product design
KW  - production engineering computing
KW  - software architecture
KW  - specification languages
KW  - user interfaces
KW  - Web ontology language
KW  - behavior evaluation
KW  - data level
KW  - metamodel level
KW  - model level
KW  - model-driven architecture
KW  - multiview engineering simulation
KW  - product design scenario
KW  - product engineering context
KW  - product lifecycle
KW  - product-related information
KW  - semantic product modeling framework
KW  - stakeholder viewpoint
KW  - user interface
KW  - Atmospheric modeling
KW  - Data models
KW  - OWL
KW  - Ontologies
KW  - Semantics
KW  - Solid modeling
KW  - Unified modeling language
KW  - Multilevel modeling framework
KW  - OWL
KW  - product information modeling
KW  - semantic product modeling
DO  - 10.1109/TASE.2011.2165210
JO  - IEEE Transactions on Automation Science and Engineering
IS  - 1
SN  - 1545-5955
VO  - 9
VL  - 9
JA  - IEEE Transactions on Automation Science and Engineering
Y1  - Jan. 2012
ER  - 

TY  - JOUR
TI  - Construction, Measurement, Shimming, and Performance of the NIST-4 Magnet System
T2  - IEEE Transactions on Instrumentation and Measurement
SP  - 3027
EP  - 3038
AU  - F. Seifert
AU  - A. Panna
AU  - S. Li
AU  - B. Han
AU  - L. Chao
AU  - A. Cao
AU  - D. Haddad
AU  - H. Choi
AU  - L. Haley
AU  - S. Schlamminger
PY  - 2014
KW  - balances
KW  - magnetic field measurement
KW  - magnetic flux
KW  - permanent magnets
KW  - wattmeters
KW  - NIST-4 permanent magnet system
KW  - National Institute of Standards and Technology
KW  - flat field profile
KW  - magnitude estimation
KW  - radial magnetic flux density
KW  - shimming technique
KW  - systematic effect
KW  - watt balance
KW  - Electromagnetic measurements
KW  - Magnetic circuits
KW  - Measurement standards
KW  - Measurement units
KW  - NIST
KW  - Permanent magnets
KW  - Electromagnetic measurements
KW  - magnetic circuits
KW  - measurement standards
KW  - measurement units
KW  - permanent magnets
KW  - permanent magnets.
DO  - 10.1109/TIM.2014.2323138
JO  - IEEE Transactions on Instrumentation and Measurement
IS  - 12
SN  - 0018-9456
VO  - 63
VL  - 63
JA  - IEEE Transactions on Instrumentation and Measurement
Y1  - Dec. 2014
ER  - 

TY  - JOUR
TI  - Introductory Remarks
T2  - IRE Transactions on Instrumentation
SP  - 211
EP  - 211
AU  - F. B. Silsbee
PY  - 1958
KW  - Atomic measurements
KW  - Electric variables measurement
KW  - Extraterrestrial measurements
KW  - Frequency measurement
KW  - Instruments
KW  - Laboratories
KW  - Length measurement
KW  - Measurement units
KW  - Microwave devices
KW  - Time measurement
DO  - 10.1109/IRE-I.1958.5006791
JO  - IRE Transactions on Instrumentation
IS  - 3
SN  - 0096-2260
VO  - I-7
VL  - I-7
JA  - IRE Transactions on Instrumentation
Y1  - Dec. 1958
ER  - 

TY  - JOUR
TI  - Breakdown of the born approximation for vibrational exchange in carbon monoxide
T2  - IEEE Journal of Quantum Electronics
SP  - 197
EP  - 197
AU  - T. Dillon
AU  - J. Stephenson
PY  - 1973
KW  - Approximation methods
KW  - Chemical lasers
KW  - Combustion
KW  - Electric breakdown
KW  - Energy exchange
KW  - Equations
KW  - Gas lasers
KW  - Kinetic theory
KW  - Laser theory
KW  - Scattering
DO  - 10.1109/JQE.1973.1077332
JO  - IEEE Journal of Quantum Electronics
IS  - 1
SN  - 0018-9197
VO  - 9
VL  - 9
JA  - IEEE Journal of Quantum Electronics
Y1  - January 1973
ER  - 

TY  - JOUR
TI  - Amorphous Nb-Si Barrier Junctions for Voltage Standard and Digital Applications
T2  - IEEE Transactions on Applied Superconductivity
SP  - 144
EP  - 148
AU  - D. Olaya
AU  - P. D. Dresselhaus
AU  - S. P. Benz
AU  - J. Bjarnason
AU  - E. N. Grossman
PY  - 2009
KW  - amorphous semiconductors
KW  - elemental semiconductors
KW  - niobium
KW  - silicon
KW  - submillimetre wave devices
KW  - superconducting junction devices
KW  - superconducting materials
KW  - AC Josephson voltage standard
KW  - Josephson junction barrier material
KW  - Nb-Si
KW  - amorphous barrier junction
KW  - frequency 400 MHz
KW  - frequency 500 MHz
KW  - frequency 75 GHz
KW  - frequency 800 GHz
KW  - high-speed superconducting digital electronic
KW  - superconducting voltage standard circuit
KW  - voltage 1 V
KW  - voltage 10 V
KW  - Josephson junctions
KW  - Josephson voltage standard
KW  - SNS junction
DO  - 10.1109/TASC.2009.2018254
JO  - IEEE Transactions on Applied Superconductivity
IS  - 3
SN  - 1051-8223
VO  - 19
VL  - 19
JA  - IEEE Transactions on Applied Superconductivity
Y1  - June 2009
ER  - 

TY  - CONF
TI  - Presentation 4. App vetting systems: Issues and challenges
T2  - 2014 IT Professional Conference
SP  - 1
EP  - 3
AU  - S. Quirolgico
PY  - 2014
KW  - mobile computing
KW  - security of data
KW  - DARPA TransApps program
KW  - application vetting system
KW  - mobile application
KW  - mobile device
KW  - security vulnerability
KW  - Decision making
KW  - Licenses
KW  - Mobile communication
KW  - NIST
KW  - Risk management
KW  - Security
KW  - Testing
DO  - 10.1109/ITPRO.2014.7029286
JO  - 2014 IT Professional Conference
IS  - 
SN  - 
VO  - 
VL  - 
JA  - 2014 IT Professional Conference
Y1  - 22-22 May 2014
ER  - 

TY  - CONF
TI  - Precise determination of the area of guarded electrodes for accurate dielectric measurements on solid-disk specimens
T2  - Annual Report 1963 Conference on Electrical Insulation
SP  - 71
EP  - 73
AU  - W. P. Harris
PY  - 1963
KW  - electrodes
KW  - permittivity
KW  - permittivity measurement
KW  - cell electrode area
KW  - dielectric constant measurement
KW  - dielectric measurements
KW  - guarded electrodes
KW  - solid-disk specimens
KW  - three-terminal air-gap method
KW  - Area measurement
KW  - Dielectric constant
KW  - Dielectric measurement
KW  - Electrodes
KW  - Fluids
KW  - Measurement uncertainty
KW  - Thickness measurement
DO  - 10.1109/EIC.1963.7466556
JO  - Annual Report 1963 Conference on Electrical Insulation
IS  - 
SN  - 
VO  - 
VL  - 
JA  - Annual Report 1963 Conference on Electrical Insulation
Y1  - 3-6 Nov. 1963
ER  - 

TY  - JOUR
TI  - Prediction-Based Vision for Robot Control
T2  - Computer
SP  - 46
EP  - 55
AU  - M. O. Shneier
AU  - R. Lumia
AU  - M. Herman
PY  - 1987
KW  - Control systems
KW  - Feedback loop
KW  - Image recognition
KW  - NIST
KW  - Orbital robotics
KW  - Path planning
KW  - Robot control
KW  - Robot sensing systems
KW  - Sensor systems
KW  - Solid modeling
DO  - 10.1109/MC.1987.1663660
JO  - Computer
IS  - 8
SN  - 0018-9162
VO  - 20
VL  - 20
JA  - Computer
Y1  - Aug. 1987
ER  - 

TY  - JOUR
TI  - Absolute Magnetic Susceptibilities by the Gouy and the Thorpe-Senftle Methods
T2  - IRE Transactions on Instrumentation
SP  - 106
EP  - 109
AU  - G. A. Candela
AU  - R. E. Mundy
PY  - 1962
KW  - Coaxial components
KW  - Coils
KW  - Electromagnetic measurements
KW  - Instruments
KW  - Laboratories
KW  - Magnetic materials
KW  - Magnetic susceptibility
KW  - Magnetic variables measurement
KW  - Testing
KW  - Transmitters
DO  - 10.1109/IRE-I.1962.5006612
JO  - IRE Transactions on Instrumentation
IS  - 3
SN  - 0096-2260
VO  - I-11
VL  - I-11
JA  - IRE Transactions on Instrumentation
Y1  - Dec. 1962
ER  - 

TY  - JOUR
TI  - Distributed Deployment Algorithms for Improved Coverage in a Network of Wireless Mobile Sensors
T2  - IEEE Transactions on Industrial Informatics
SP  - 163
EP  - 174
AU  - H. Mahboubi
AU  - K. Moezzi
AU  - A. G. Aghdam
AU  - K. Sayrafian-Pour
AU  - V. Marbukh
PY  - 2014
KW  - mobile radio
KW  - sensor placement
KW  - wireless sensor networks
KW  - Voronoi polygon
KW  - distributed deployment algorithm
KW  - edge-based strategy
KW  - efficient sensor deployment strategy
KW  - vertex-based strategy
KW  - wireless mobile sensor network
KW  - Mobile communication
KW  - Mobile computing
KW  - NIST
KW  - Sensor phenomena and characterization
KW  - Silicon
KW  - Wireless sensor networks
KW  - Coverage
KW  - mobile sensors
KW  - wireless sensor networks
DO  - 10.1109/TII.2013.2280095
JO  - IEEE Transactions on Industrial Informatics
IS  - 1
SN  - 1551-3203
VO  - 10
VL  - 10
JA  - IEEE Transactions on Industrial Informatics
Y1  - Feb. 2014
ER  - 

TY  - CONF
TI  - A low-complexity tree-search algorithm to decode diversity-oriented block codes with inter-symbol interference
T2  - 2012 IEEE International Conference on Communications (ICC)
SP  - 4240
EP  - 4245
AU  - C. Xu
AU  - H. Gharavi
PY  - 2012
KW  - MIMO communication
KW  - block codes
KW  - cooperative communication
KW  - delays
KW  - interference suppression
KW  - intersymbol interference
KW  - maximum likelihood decoding
KW  - tree searching
KW  - ACLDC
KW  - MIMO system
KW  - ML algorithm
KW  - asynchronous cooperative liner dispersion codes
KW  - block based cooperative multiple-input-multiple-output system
KW  - decoding complexity
KW  - differential propagation delay
KW  - diversity-oriented block codes
KW  - effective symbol rate
KW  - guard interval
KW  - intersymbol interference mitigation
KW  - maximum likelihood decoding algorithm
KW  - novel low-complexity breadth-adjustable tree-search algorithm
KW  - Government
KW  - Signal to noise ratio
KW  - Wireless communication
DO  - 10.1109/ICC.2012.6363870
JO  - 2012 IEEE International Conference on Communications (ICC)
IS  - 
SN  - 1550-3607
VO  - 
VL  - 
JA  - 2012 IEEE International Conference on Communications (ICC)
Y1  - 10-15 June 2012
ER  - 

TY  - JOUR
TI  - Electrochemistry and electrical engineering
T2  - Electrical Engineering
SP  - 238
EP  - 242
AU  - G. W. Vinal
PY  - 1932
KW  - Aluminum
KW  - Anodes
KW  - Chromium
KW  - Copper
KW  - Electrochemical processes
KW  - Furnaces
DO  - 10.1109/EE.1932.6429756
JO  - Electrical Engineering
IS  - 4
SN  - 0095-9197
VO  - 51
VL  - 51
JA  - Electrical Engineering
Y1  - April 1932
ER  - 

TY  - JOUR
TI  - Important Considerations for SEM Total Dose Testing
T2  - IEEE Transactions on Nuclear Science
SP  - 2066
EP  - 2070
AU  - K. F. Galloway
AU  - P. Roitman
PY  - 1977
KW  - Electron beams
KW  - Energy dissipation
KW  - Insulation
KW  - Ionizing radiation
KW  - NIST
KW  - Roentgenium
KW  - Scanning electron microscopy
KW  - Semiconductor device reliability
KW  - Semiconductor devices
KW  - Testing
DO  - 10.1109/TNS.1977.4329166
JO  - IEEE Transactions on Nuclear Science
IS  - 6
SN  - 0018-9499
VO  - 24
VL  - 24
JA  - IEEE Transactions on Nuclear Science
Y1  - Dec. 1977
ER  - 

TY  - JOUR
TI  - Note on Piezoelectric Generators with Small Back Action
T2  - Proceedings of the Institute of Radio Engineers
SP  - 725
EP  - 726
AU  - A. Hund
PY  - 1927
KW  - Automatic control
KW  - Circuit optimization
KW  - Coils
KW  - Copper
KW  - Frequency
KW  - Oscillators
KW  - Power dissipation
KW  - Telegraphy
KW  - Tuning
KW  - Voltage
DO  - 10.1109/JRPROC.1927.221253
JO  - Proceedings of the Institute of Radio Engineers
IS  - 8
SN  - 0731-5996
VO  - 15
VL  - 15
JA  - Proceedings of the Institute of Radio Engineers
Y1  - Aug. 1927
ER  - 

TY  - JOUR
TI  - Phase Noise Performance of Optoelectronic Oscillators Based on Whispering-Gallery Mode Resonators
T2  - IEEE Journal of Quantum Electronics
SP  - 1
EP  - 8
AU  - R. M. Nguimdo
AU  - K. Saleh
AU  - A. Coillet
AU  - G. Lin
AU  - R. Martinenghi
AU  - Y. K. Chembo
PY  - 2015
KW  - Q-factor
KW  - integrated optics
KW  - integrated optoelectronics
KW  - microwave photonics
KW  - optical delay lines
KW  - optical noise
KW  - optical resonators
KW  - phase noise
KW  - stochastic processes
KW  - whispering gallery modes
KW  - delay line
KW  - high-Q disk-shaped WGMR
KW  - optical delay line
KW  - optoelectronic oscillators
KW  - phase noise performance
KW  - spurious peak rejection
KW  - stochastic model
KW  - ultrahigh Q-factor resonator
KW  - ultrastable microwave generation
KW  - whispering-gallery mode resonators
KW  - Delays
KW  - Optical feedback
KW  - Optical resonators
KW  - Phase noise
KW  - Q-factor
KW  - Radio frequency
KW  - Optoelectronic oscillators
KW  - microwave generation
KW  - phase noise
KW  - whispering-gallery mode resonators
DO  - 10.1109/JQE.2015.2488981
JO  - IEEE Journal of Quantum Electronics
IS  - 11
SN  - 0018-9197
VO  - 51
VL  - 51
JA  - IEEE Journal of Quantum Electronics
Y1  - Nov. 2015
ER  - 

TY  - JOUR
TI  - Standards and measurements for electronics [Conference introduction]
T2  - IRE Transactions on Instrumentation
SP  - 134
EP  - 135
AU  - A. V. Astin
PY  - 1958
KW  - Electromagnetic measurements
KW  - Instruments
KW  - Laboratories
KW  - Measurement standards
KW  - Measurement techniques
KW  - NIST
KW  - Particle measurements
KW  - Prototypes
KW  - Radio frequency
KW  - UHF measurements
DO  - 10.1109/IRE-I.1958.5006782
JO  - IRE Transactions on Instrumentation
IS  - 3
SN  - 0096-2260
VO  - I-7
VL  - I-7
JA  - IRE Transactions on Instrumentation
Y1  - Dec. 1958
ER  - 

TY  - JOUR
TI  - Boolean Matrix Equations in Digital Circuit Design
T2  - IRE Transactions on Electronic Computers
SP  - 131
EP  - 139
AU  - R. S. Ledley
PY  - 1959
KW  - Argon
KW  - Artificial intelligence
KW  - Boolean functions
KW  - Circuit synthesis
KW  - Digital circuits
KW  - Equations
KW  - Information systems
KW  - NIST
KW  - Wires
KW  - Wiring
DO  - 10.1109/TEC.1959.5219514
JO  - IRE Transactions on Electronic Computers
IS  - 2
SN  - 0367-9950
VO  - EC-8
VL  - EC-8
JA  - IRE Transactions on Electronic Computers
Y1  - June 1959
ER  - 

TY  - JOUR
TI  - 0.5 V Supply Voltage Operation of In<sub>0.65</sub>Ga<sub>0.35</sub>As/GaAs<sub>0.4</sub>Sb<sub>0.6</sub> Tunnel FET
T2  - IEEE Electron Device Letters
SP  - 20
EP  - 22
AU  - B. Rajamohanan
AU  - R. Pandey
AU  - V. Chobpattana
AU  - C. Vaz
AU  - D. Gundlach
AU  - K. P. Cheung
AU  - J. Suehle
AU  - S. Stemmer
AU  - S. Datta
PY  - 2015
KW  - III-V semiconductors
KW  - electric current measurement
KW  - field effect transistors
KW  - gallium arsenide
KW  - high-k dielectric thin films
KW  - indium compounds
KW  - tunnel transistors
KW  - voltage measurement
KW  - wide band gap semiconductors
KW  - In<sub>0.65</sub>Ga<sub>0.35</sub>As-GaAs<sub>0.4</sub>Sb<sub>0.6</sub>
KW  - drive current
KW  - electrical quality
KW  - fast current-voltage measurements
KW  - high-&#x03BA; gate-stack
KW  - low damage mesa sidewall etch
KW  - staggered-gap TFET
KW  - switching slope
KW  - tunneling field-effect transistors
KW  - voltage 0.5 V
KW  - Hafnium compounds
KW  - Logic gates
KW  - Nickel
KW  - Silicon
KW  - Switches
KW  - Transistors
KW  - Tunneling
KW  - III-V
KW  - Steep Switching Slope
KW  - Tunnel FET
KW  - steep switching slope
KW  - tunnel FET
DO  - 10.1109/LED.2014.2368147
JO  - IEEE Electron Device Letters
IS  - 1
SN  - 0741-3106
VO  - 36
VL  - 36
JA  - IEEE Electron Device Letters
Y1  - Jan. 2015
ER  - 

TY  - JOUR
TI  - A sensitivity analysis of SPICE parameters using an eleven-stage ring oscillator
T2  - IEEE Transactions on Electron Devices
SP  - 264
EP  - 269
AU  - J. M. Cassard
PY  - 1984
KW  - Circuit simulation
KW  - Circuit testing
KW  - Manufacturing processes
KW  - Predictive models
KW  - Ring oscillators
KW  - SPICE
KW  - Semiconductor device measurement
KW  - Semiconductor device modeling
KW  - Sensitivity analysis
KW  - Voltage
DO  - 10.1109/T-ED.1984.21511
JO  - IEEE Transactions on Electron Devices
IS  - 2
SN  - 0018-9383
VO  - 31
VL  - 31
JA  - IEEE Transactions on Electron Devices
Y1  - Feb 1984
ER  - 

TY  - CONF
TI  - SIM.EM-S5 voltage, current and resistance comparison
T2  - 2012 Conference on Precision electromagnetic Measurements
SP  - 566
EP  - 567
AU  - H. Sanchez
AU  - J. Cioffi
AU  - G. Kyriazis
AU  - R. Ramos
AU  - A. Martinez
AU  - J. Montaluisa
AU  - J. Gonzalez
AU  - H. Postigo
AU  - F. Hamilton
AU  - R. Elmquist
AU  - N. f. Zhang
AU  - D. Izquierdo
PY  - 2012
KW  - calibration
KW  - electric current measurement
KW  - electric resistance measurement
KW  - measurement uncertainty
KW  - multimeters
KW  - voltage measurement
KW  - CIPM mutual recognition agreement
KW  - Interamerican Metrology System
KW  - NIST-USA
KW  - NMI
KW  - National Metrology Institutes
KW  - SIM.EM-S5
KW  - digital multimeter calibration
KW  - measurement points
KW  - pilot laboratory
KW  - Atmospheric measurements
KW  - Humidity measurement
KW  - Measurement uncertainty
KW  - Particle measurements
KW  - Standards
KW  - Temperature measurement
KW  - Uncertainty
KW  - Comparison
KW  - measurement error
KW  - measurement uncertainty
KW  - multimeter
DO  - 10.1109/CPEM.2012.6251055
JO  - 2012 Conference on Precision electromagnetic Measurements
IS  - 
SN  - 0589-1485
VO  - 
VL  - 
JA  - 2012 Conference on Precision electromagnetic Measurements
Y1  - 1-6 July 2012
ER  - 

TY  - CONF
TI  - Hotspot dynamics in current carrying WSi superconducting nanowires
T2  - 2014 Conference on Lasers and Electro-Optics (CLEO) - Laser Science to Photonic Applications
SP  - 1
EP  - 2
AU  - F. Marsili
AU  - M. J. Stevens
AU  - A. Kozorezov
AU  - V. B. Verma
AU  - C. Lambert
AU  - J. A. Stern
AU  - R. Horansky
AU  - S. Dyer
AU  - M. D. Shaw
AU  - R. P. Mirin
AU  - S. W. Nam
PY  - 2014
KW  - nanowires
KW  - superconducting materials
KW  - tungsten compounds
KW  - WSi
KW  - bias current
KW  - current carrying WSi superconducting nanowires
KW  - hotspot dynamics
KW  - hotspot relaxation
KW  - optically excited hotspots
KW  - temporal dynamics
KW  - Current measurement
KW  - Detectors
KW  - Nanowires
KW  - Optical pulses
KW  - Superconducting photodetectors
KW  - Temperature measurement
KW  - Wavelength measurement
DO  - 10.1364/CLEO_QELS.2014.FM4B.7
JO  - 2014 Conference on Lasers and Electro-Optics (CLEO) - Laser Science to Photonic Applications
IS  - 
SN  - 2160-8989
VO  - 
VL  - 
JA  - 2014 Conference on Lasers and Electro-Optics (CLEO) - Laser Science to Photonic Applications
Y1  - 8-13 June 2014
ER  - 

TY  - JOUR
TI  - Radiation patterns of finite-size corner-reflector antennas
T2  - IRE Transactions on Antennas and Propagation
SP  - 144
EP  - 157
AU  - A. Wilson
AU  - H. Cottony
PY  - 1960
KW  - Corner reflector antennas
KW  - Reflector antennas, corner
KW  - Antenna measurements
KW  - Antenna radiation patterns
KW  - Antenna theory
KW  - Antennas and propagation
KW  - Apertures
KW  - Dipole antennas
KW  - Reflector antennas
KW  - Scattering
KW  - Testing
KW  - VHF circuits
DO  - 10.1109/TAP.1960.1144830
JO  - IRE Transactions on Antennas and Propagation
IS  - 2
SN  - 0096-1973
VO  - 8
VL  - 8
JA  - IRE Transactions on Antennas and Propagation
Y1  - March 1960
ER  - 

TY  - JOUR
TI  - Horizontal Time Base Sweep Generator for a Traveling Wave Oscilloscope
T2  - IEEE Transactions on Nuclear Science
SP  - 3
EP  - 8
AU  - J. R. Andrews
PY  - 1971
KW  - Capacitance
KW  - Cathode ray tubes
KW  - Instruments
KW  - NIST
KW  - Oscilloscopes
KW  - Pulse generation
KW  - Signal generators
KW  - Switches
KW  - Timing
KW  - Voltage control
DO  - 10.1109/TNS.1971.4326389
JO  - IEEE Transactions on Nuclear Science
IS  - 5
SN  - 0018-9499
VO  - 18
VL  - 18
JA  - IEEE Transactions on Nuclear Science
Y1  - Oct. 1971
ER  - 

TY  - JOUR
TI  - Freedom and social responsibilities
T2  - IEEE Spectrum
SP  - 59
EP  - 60
AU  - R. W. Roberts
PY  - 1974
KW  - Computers
KW  - Laboratories
KW  - NIST
KW  - National security
KW  - Patents
KW  - Privacy
DO  - 10.1109/MSPEC.1974.6366478
JO  - IEEE Spectrum
IS  - 4
SN  - 0018-9235
VO  - 11
VL  - 11
JA  - IEEE Spectrum
Y1  - April 1974
ER  - 

TY  - CONF
TI  - Tests of the Recalibration Period of a Drifting Instrument
T2  - OCEANS '86
SP  - 923
EP  - 928
AU  - W. Liggett
PY  - 1986
KW  - Calibration
KW  - Curve fitting
KW  - Frequency
KW  - Instruments
KW  - Kalman filters
KW  - Monitoring
KW  - Robustness
KW  - Spline
KW  - Testing
DO  - 10.1109/OCEANS.1986.1160399
JO  - OCEANS '86
IS  - 
SN  - 
VO  - 
VL  - 
JA  - OCEANS '86
Y1  - 23-25 Sept. 1986
ER  - 

TY  - CONF
TI  - Josephon Array Voltage Calibration System: Operational Use and Verification
T2  - 1988 Conference on Precision Electromagnetic Measurements
SP  - 1
EP  - 2
AU  - R. L. Steiner
AU  - B. F. Field
PY  - 1988
DO  - 10.1109/CPEM.1988.671140
JO  - 1988 Conference on Precision Electromagnetic Measurements
IS  - 
SN  - 
VO  - 
VL  - 
JA  - 1988 Conference on Precision Electromagnetic Measurements
Y1  - 7-10 June 1988
ER  - 

TY  - JOUR
TI  - Switching Distributions for Perpendicular Spin-Torque Devices Within the Macrospin Approximation
T2  - IEEE Transactions on Magnetics
SP  - 4684
EP  - 4700
AU  - W. H. Butler
AU  - T. Mewes
AU  - C. K. A. Mewes
AU  - P. B. Visscher
AU  - W. H. Rippard
AU  - S. E. Russek
AU  - R. Heindl
PY  - 2012
KW  - Fokker-Planck equation
KW  - critical currents
KW  - current density
KW  - damping
KW  - magnetic film stores
KW  - magnetic switching
KW  - magnetic thin films
KW  - magnetisation
KW  - probability
KW  - spin fluctuations
KW  - torque
KW  - Fokker-Planck equation
KW  - Gilbert damping
KW  - approximate analytical expression
KW  - closed form analytical expression
KW  - critical current density
KW  - exponential decay
KW  - free-layer magnetization
KW  - macrospin approximation
KW  - perpendicular free layer
KW  - perpendicular spin-torque devices
KW  - pinned layer magnetization
KW  - precession frequency
KW  - probability distribution
KW  - random fluctuating held
KW  - short-time regime
KW  - single-macrospin Landau-Lifshitz-Gilbert equations
KW  - soft error rates
KW  - spin-torque memory devices
KW  - switching distributions
KW  - zero-temperature switching time
KW  - Approximation methods
KW  - Equations
KW  - Films
KW  - Magnetic tunneling
KW  - Magnetization
KW  - Mathematical model
KW  - Switches
KW  - Error rate
KW  - Fokker-Planck
KW  - magnetic memory
KW  - spin torque
KW  - switching distribution
DO  - 10.1109/TMAG.2012.2209122
JO  - IEEE Transactions on Magnetics
IS  - 12
SN  - 0018-9464
VO  - 48
VL  - 48
JA  - IEEE Transactions on Magnetics
Y1  - Dec. 2012
ER  - 

TY  - JOUR
TI  - Humans' Critical Role in Smart Systems: A Smart Firefighting Example
T2  - IEEE Internet Computing
SP  - 28
EP  - 31
AU  - A. Jones
AU  - E. Subrahmanian
AU  - A. Hamins
AU  - C. Grant
PY  - 2015
KW  - emergency management
KW  - fires
KW  - human computer interaction
KW  - smart firefighting
KW  - smart system
KW  - Computational modeling
KW  - Cyber-physical systems
KW  - Fires
KW  - Human factors
KW  - Integrated circuit modeling
KW  - Predictive models
KW  - Sensor phenomena and characterization
KW  - CPSS
KW  - Internet/Web technologies
KW  - PCS
KW  - cyber-physical-social systems
KW  - joint cognitive systems
KW  - physical-cyber-social computing
KW  - smart firefighting
KW  - smart systems
KW  - standards
DO  - 10.1109/MIC.2015.54
JO  - IEEE Internet Computing
IS  - 3
SN  - 1089-7801
VO  - 19
VL  - 19
JA  - IEEE Internet Computing
Y1  - May-June 2015
ER  - 

TY  - CONF
TI  - A new ultralow-frequency bridge for dielectric measurements
T2  - Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1966
SP  - 72
EP  - 74
AU  - W. P. Harris
PY  - 1966
KW  - Bridge circuits
KW  - Capacitance
KW  - Capacitors
KW  - Detectors
KW  - Dielectric measurement
KW  - NIST
KW  - Operational amplifiers
DO  - 10.1109/CEIDP.1966.7725196
JO  - Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1966
IS  - 
SN  - 
VO  - 
VL  - 
JA  - Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1966
Y1  - 3-6 Oct. 1966
ER  - 

TY  - JOUR
TI  - Methods for testing current transformers
T2  - Journal of the A.I.E.E.
SP  - 239
EP  - 249
AU  - F. B. Silsbee
PY  - 1924
DO  - 10.1109/JAIEE.1924.6534039
JO  - Journal of the A.I.E.E.
IS  - 3
SN  - 0095-9804
VO  - 43
VL  - 43
JA  - Journal of the A.I.E.E.
Y1  - March 1924
ER  - 

TY  - JOUR
TI  - Practical Combinatorial Testing: Beyond Pairwise
T2  - IT Professional
SP  - 19
EP  - 23
AU  - R. Kuhn
AU  - Y. Lei
AU  - R. Kacker
PY  - 2008
KW  - program testing
KW  - program verification
KW  - combinatorial testing
KW  - covering-array algorithm
KW  - failure detection
KW  - model checking
KW  - Automatic testing
KW  - Databases
KW  - Distributed computing
KW  - NASA
KW  - NIST
KW  - Quality assurance
KW  - Sensor arrays
KW  - Sensor systems
KW  - Software testing
KW  - System testing
KW  - all-pairs testing
KW  - assurance
KW  - combinatorial testing
KW  - debugging
KW  - faults
KW  - pairwise testing
DO  - 10.1109/MITP.2008.54
JO  - IT Professional
IS  - 3
SN  - 1520-9202
VO  - 10
VL  - 10
JA  - IT Professional
Y1  - May-June 2008
ER  - 

TY  - CONF
TI  - The permanent magnet system for NIST-4
T2  - 2012 Conference on Precision electromagnetic Measurements
SP  - 334
EP  - 335
AU  - S. Schlamminger
PY  - 2012
KW  - magnetic flux
KW  - magnetic variables measurement
KW  - permanent magnets
KW  - NIST-4
KW  - magnetic flux
KW  - permanent magnet system
KW  - Coils
KW  - Magnetic field measurement
KW  - Magnetic flux
KW  - Magnetic hysteresis
KW  - Magnetic noise
KW  - Magnetic separation
KW  - Magnetic shielding
KW  - NIST
KW  - Planck constant
KW  - SI units
KW  - watt balance
DO  - 10.1109/CPEM.2012.6250938
JO  - 2012 Conference on Precision electromagnetic Measurements
IS  - 
SN  - 0589-1485
VO  - 
VL  - 
JA  - 2012 Conference on Precision electromagnetic Measurements
Y1  - 1-6 July 2012
ER  - 

TY  - CONF
TI  - On-wafer Testing Issues for the 90's and Beyond
T2  - 38th ARFTG Conference Digest
SP  - 139
EP  - 169
AU  - E. Strid
AU  - D. Dunn
AU  - M. Shakouri
AU  - D. Williams
AU  - M. Golio
PY  - 1991
KW  - Costs
KW  - Electric variables measurement
KW  - Foundries
KW  - Frequency measurement
KW  - MMICs
KW  - Probes
KW  - Production
KW  - Semiconductor device modeling
KW  - Testing
KW  - Time measurement
DO  - 10.1109/ARFTG.1991.324047
JO  - 38th ARFTG Conference Digest
IS  - 
SN  - 
VO  - 20
VL  - 20
JA  - 38th ARFTG Conference Digest
Y1  - 5-6 Dec. 1991
ER  - 

TY  - JOUR
TI  - Terahertz Laser Power Measurement Comparison
T2  - IEEE Transactions on Terahertz Science and Technology
SP  - 664
EP  - 669
AU  - A. Steiger
AU  - R. Müller
AU  - A. R. Oliva
AU  - Y. Deng
AU  - Q. Sun
AU  - M. White
AU  - J. Lehman
PY  - 2016
KW  - laser beams
KW  - laser variables measurement
KW  - microwave photonics
KW  - optical pumping
KW  - terahertz wave detectors
KW  - Gaussian beam profile
KW  - THz detector calibration facility
KW  - THz radiation source
KW  - frequency 0.762 THz
KW  - frequency 2.52 THz
KW  - laser frequency
KW  - line-tunable CO<sub>2</sub> laser
KW  - molecular gas laser
KW  - national standard THz detector
KW  - power level
KW  - power stability
KW  - terahertz laser power measurement
KW  - uncertainty arithmetic mean
KW  - wavelength 119 mum
KW  - wavelength 394 mum
KW  - Detectors
KW  - Gas lasers
KW  - Laser beams
KW  - Laser excitation
KW  - Measurement by laser beam
KW  - Power lasers
KW  - Uncertainty
KW  - Metrology
KW  - THz laser
KW  - radiometry
KW  - terahertz (THz) detector
DO  - 10.1109/TTHZ.2016.2590260
JO  - IEEE Transactions on Terahertz Science and Technology
IS  - 5
SN  - 2156-342X
VO  - 6
VL  - 6
JA  - IEEE Transactions on Terahertz Science and Technology
Y1  - Sept. 2016
ER  - 

TY  - JOUR
TI  - The Impact of Data Dependence on Speaker Recognition Evaluation
T2  - IEEE/ACM Transactions on Audio, Speech, and Language Processing
SP  - 5
EP  - 18
AU  - J. C. Wu
AU  - A. F. Martin
AU  - C. S. Greenberg
AU  - R. N. Kacker
PY  - 2017
KW  - probability
KW  - speaker recognition
KW  - statistical analysis
KW  - DCF
KW  - SE
KW  - detection cost function
KW  - hypothesis testing
KW  - i.i.d. assumption
KW  - nonparametric two-sample one layer bootstrap method
KW  - nonparametric two-sample two-layer bootstrap method
KW  - speaker recognition evaluation
KW  - standard error
KW  - two-layer data structure
KW  - type I error probability
KW  - type II error probability
KW  - Algorithm design and analysis
KW  - Data structures
KW  - Distributed databases
KW  - Speaker recognition
KW  - Speech
KW  - Standards
KW  - Training
KW  - Bootstrap
KW  - data dependence
KW  - multinomial probability
KW  - resampling
KW  - speaker recognition
KW  - standard error (SE)
DO  - 10.1109/TASLP.2016.2614725
JO  - IEEE/ACM Transactions on Audio, Speech, and Language Processing
IS  - 1
SN  - 2329-9290
VO  - 25
VL  - 25
JA  - IEEE/ACM Transactions on Audio, Speech, and Language Processing
Y1  - Jan. 2017
ER  - 

TY  - JOUR
TI  - Common-Arm Counterpropagating Interferometer for Measurement of Vibration-Induced Noise in Fibers
T2  - IEEE Photonics Technology Letters
SP  - 1633
EP  - 1635
AU  - C. W. Nelson
AU  - A. Hati
AU  - D. A. Howe
PY  - 2011
KW  - light interferometers
KW  - light propagation
KW  - noise measurement
KW  - optical fibres
KW  - phase noise
KW  - vibration measurement
KW  - common-arm counterpropagating interferometer
KW  - fiber-based optical components
KW  - fiber-based optical devices
KW  - frequency 192 THz
KW  - frequency-shifted interferometer
KW  - interconnecting fibers
KW  - vibrating fibers
KW  - vibration sensitivity measurement
KW  - vibration-induced noise measurement
KW  - vibration-induced phase noise
KW  - Optical fiber polarization
KW  - Optical fiber sensors
KW  - Sensitivity
KW  - Vibration measurement
KW  - Vibrations
KW  - Interferometry
KW  - optical fibers
KW  - phase measurement
KW  - phase noise
KW  - vibration measurement
DO  - 10.1109/LPT.2011.2165839
JO  - IEEE Photonics Technology Letters
IS  - 21
SN  - 1041-1135
VO  - 23
VL  - 23
JA  - IEEE Photonics Technology Letters
Y1  - Nov.1, 2011
ER  - 

TY  - JOUR
TI  - Ancile: Pervasively Shared Situational Awareness
T2  - IEEE Internet Computing
SP  - 48
EP  - 50
AU  - F. Maymi
AU  - M. Rodriguez-Martinez
AU  - Y. Qian
AU  - P. C. Manz
PY  - 2008
KW  - military computing
KW  - ubiquitous computing
KW  - Ancile architecture
KW  - distributed architecture
KW  - information sharing
KW  - prototypical military information system
KW  - Command and control systems
KW  - Computer architecture
KW  - Explosives
KW  - Information systems
KW  - Mortar
KW  - Personnel
KW  - Prototypes
KW  - Terrorism
KW  - Time factors
KW  - Vehicles
KW  - Ancile
KW  - crisis management
KW  - emergency response
KW  - peer-to-peer systems
KW  - situational awareness
DO  - 10.1109/MIC.2008.3
JO  - IEEE Internet Computing
IS  - 1
SN  - 1089-7801
VO  - 12
VL  - 12
JA  - IEEE Internet Computing
Y1  - Jan.-Feb. 2008
ER  - 

TY  - JOUR
TI  - On Prediction of System Behavior
T2  - IRE Transactions on Reliability and Quality Control
SP  - 23
EP  - 28
AU  - J. R. Rosenblatt
PY  - 1960
KW  - Assembly systems
KW  - Environmental factors
KW  - Humans
KW  - Mathematical model
KW  - Predictive models
KW  - Probability distribution
KW  - Quality control
KW  - Reliability theory
KW  - State estimation
KW  - System performance
DO  - 10.1109/IRE-PGRQC.1960.5007305
JO  - IRE Transactions on Reliability and Quality Control
IS  - 3
SN  - 0097-4552
VO  - RQC-9
VL  - RQC-9
JA  - IRE Transactions on Reliability and Quality Control
Y1  - Dec. 1960
ER  - 

TY  - JOUR
TI  - Calibration-Kit Design for Millimeter-Wave Silicon Integrated Circuits
T2  - IEEE Transactions on Microwave Theory and Techniques
SP  - 2685
EP  - 2694
AU  - D. F. Williams
AU  - P. Corson
AU  - J. Sharma
AU  - H. Krishnaswamy
AU  - W. Tai
AU  - Z. George
AU  - D. Ricketts
AU  - P. Watson
AU  - E. Dacquay
AU  - S. P. Voinigescu
PY  - 2013
KW  - MIMIC
KW  - elemental semiconductors
KW  - error analysis
KW  - integrated circuit design
KW  - network analysers
KW  - silicon
KW  - calibration-kit design
KW  - circuit characterization
KW  - contact repeatability
KW  - contact-pad capacitances
KW  - contact-pad designs
KW  - design guidelines
KW  - error analysis
KW  - fill-free transmission line structure
KW  - fixed-fill contacts
KW  - gold plating process
KW  - mesh-free transmission line structure
KW  - meshed ground plane
KW  - millimeter-wave frequencies
KW  - millimeter-wave silicon integrated circuits
KW  - multiline calibrations
KW  - state-of-the-art transistor characterization
KW  - thru-reflect-line vector network analyzer calibration kits
KW  - transistor characterization
KW  - Calibration
KW  - Capacitance
KW  - Impedance
KW  - Metals
KW  - Power transmission lines
KW  - Silicon
KW  - Transmission line measurements
KW  - Calibration
KW  - measurement
KW  - millimeter wave
KW  - scattering parameters
KW  - silicon
KW  - transistor
KW  - uncertainty
KW  - vector network analyzer
DO  - 10.1109/TMTT.2013.2265685
JO  - IEEE Transactions on Microwave Theory and Techniques
IS  - 7
SN  - 0018-9480
VO  - 61
VL  - 61
JA  - IEEE Transactions on Microwave Theory and Techniques
Y1  - July 2013
ER  - 

TY  - JOUR
TI  - Geomagnetic micropulsations
T2  - Proceedings of the IEEE
SP  - 507
EP  - 507
AU  - W. Campbell
PY  - 1963
DO  - 10.1109/PROC.1963.1904
JO  - Proceedings of the IEEE
IS  - 3
SN  - 0018-9219
VO  - 51
VL  - 51
JA  - Proceedings of the IEEE
Y1  - March 1963
ER  - 

TY  - CONF
TI  - Minority-carrier dynamics in semiconductors probed by two-photon microscopy
T2  - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
SP  - 3037
EP  - 3040
AU  - B. Gaury
AU  - P. M. Haney
PY  - 2016
KW  - carrier lifetime
KW  - diffusion
KW  - minority carriers
KW  - photoluminescence
KW  - semiconductor devices
KW  - semiconductor materials
KW  - surface recombination
KW  - 3D diffusion equation
KW  - bulk recombination
KW  - carrier lifetime
KW  - enhanced recombination
KW  - low-injection regime
KW  - minority-carrier dynamics
KW  - photoluminescence decays
KW  - probed interface
KW  - semiconductor devices
KW  - surface recombination velocity
KW  - two-photon microscopy
KW  - two-photon time-resolved photoluminescence
KW  - Microscopy
KW  - Nanoscale devices
KW  - Nonlinear optics
KW  - Photoluminescence
KW  - Radiative recombination
KW  - Two-photon microscopy
KW  - carrier lifetime
KW  - surface recombination velocity
DO  - 10.1109/PVSC.2016.7750222
JO  - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
IS  - 
SN  - 
VO  - 
VL  - 
JA  - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
Y1  - 5-10 June 2016
ER  - 

TY  - CONF
TI  - Josephson-based full digital bridge for high-accuracy impedance comparisons
T2  - 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)
SP  - 1
EP  - 2
AU  - F. Overney
AU  - N. E. Flowers-Jacobs
AU  - B. Jeanneret
AU  - A. Rüfenacht
AU  - A. E. Fox
AU  - J. M. Underwood
AU  - A. D. Koffman
AU  - S. P. Benz
PY  - 2016
KW  - calibration
KW  - electric impedance measurement
KW  - measurement standards
KW  - voltage measurement
KW  - ACJVS source
KW  - Josephson-based full digital bridge
KW  - Josephson-based impedance bridge
KW  - dual AC Josephson voltage standard source
KW  - high-accuracy impedance comparison
KW  - high-precision impedance calibration
KW  - Bridge circuits
KW  - Electrical resistance measurement
KW  - Impedance
KW  - Impedance measurement
KW  - NIST
KW  - Voltage measurement
KW  - AC Josephson voltage standard
KW  - Impedance comparison
KW  - ac coaxial bridge
KW  - digital bridge
DO  - 10.1109/CPEM.2016.7540628
JO  - 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)
IS  - 
SN  - 
VO  - 
VL  - 
JA  - 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)
Y1  - 10-15 July 2016
ER  - 

TY  - JOUR
TI  - Detection of High Altitude Nuclear Detonations Using the VLF Phase Shift Technique
T2  - IEEE Transactions on Nuclear Science
SP  - 242
EP  - 253
AU  - A. G. Jean
AU  - D. D. Crombie
PY  - 1963
KW  - Clouds
KW  - Delay effects
KW  - Earth
KW  - Gamma ray effects
KW  - Ionization
KW  - Ionosphere
KW  - Neutrons
KW  - Phase detection
KW  - Weapons
KW  - X-rays
DO  - 10.1109/TNS.1963.4323267
JO  - IEEE Transactions on Nuclear Science
IS  - 1
SN  - 0018-9499
VO  - 10
VL  - 10
JA  - IEEE Transactions on Nuclear Science
Y1  - Jan. 1963
ER  - 

TY  - CONF
TI  - Further Examination of the Injection-Locked Dual Optoelectronic Oscillator
T2  - 2007 IEEE International Frequency Control Symposium Joint with the 21st European Frequency and Time Forum
SP  - 796
EP  - 800
AU  - K. M. Hudek
AU  - A. Hati
AU  - D. A. Howe
AU  - C. W. Nelson
AU  - W. Zhou
PY  - 2007
KW  - Q-factor
KW  - electro-optical modulation
KW  - injection locked oscillators
KW  - optical fibres
KW  - optical resonators
KW  - optoelectronic devices
KW  - high-Q stability
KW  - injection-locked dual OEO
KW  - multimode oscillation
KW  - optoelectronic oscillator
KW  - Delay lines
KW  - Injection-locked oscillators
KW  - Master-slave
KW  - Optical fiber communication
KW  - Optical filters
KW  - Optical losses
KW  - Performance analysis
KW  - Radio frequency
KW  - Signal generators
KW  - Stability
DO  - 10.1109/FREQ.2007.4319185
JO  - 2007 IEEE International Frequency Control Symposium Joint with the 21st European Frequency and Time Forum
IS  - 
SN  - 2327-1914
VO  - 
VL  - 
JA  - 2007 IEEE International Frequency Control Symposium Joint with the 21st European Frequency and Time Forum
Y1  - May 29 2007-June 1 2007
ER  - 

TY  - CONF
TI  - Estimating uncertainty limits in the NIST-2008 electronic kilogram
T2  - 2008 Conference on Precision Electromagnetic Measurements Digest
SP  - 10
EP  - 11
AU  - R. L. Steiner
AU  - E. R. Williams
AU  - R. Liu
AU  - B. Parker
PY  - 2008
KW  - mass measurement
KW  - measurement uncertainty
KW  - electronic kilogram
KW  - measurement uncertainties
KW  - uncertainty limit estimation
KW  - Acceleration
KW  - Atomic measurements
KW  - Coils
KW  - Electrical resistance measurement
KW  - Force measurement
KW  - Gravity
KW  - Magnetic field measurement
KW  - NIST
KW  - Uncertainty
KW  - Velocity measurement
DO  - 10.1109/CPEM.2008.4574627
JO  - 2008 Conference on Precision Electromagnetic Measurements Digest
IS  - 
SN  - 0589-1485
VO  - 
VL  - 
JA  - 2008 Conference on Precision Electromagnetic Measurements Digest
Y1  - 8-13 June 2008
ER  - 

TY  - JOUR
TI  - Al-Mn Transition Edge Sensors for Cosmic Microwave Background Polarimeters
T2  - IEEE Transactions on Applied Superconductivity
SP  - 196
EP  - 198
AU  - D. R. Schmidt
AU  - H. M. Cho
AU  - J. Hubmayr
AU  - P. Lowell
AU  - M. D. Niemack
AU  - G. C. O'Neil
AU  - J. N. Ullom
AU  - K. W. Yoon
AU  - K. D. Irwin
AU  - W. L. Holzapfel
AU  - M. Lueker
AU  - E. M. George
AU  - E. Shirokoff
PY  - 2011
KW  - aluminium alloys
KW  - astronomical polarimetry
KW  - astronomical telescopes
KW  - calorimeters
KW  - frequency division multiplexing
KW  - manganese alloys
KW  - polarimeters
KW  - radiofrequency cosmic radiation
KW  - readout electronics
KW  - superconducting particle detectors
KW  - superconducting thin films
KW  - superconducting transition temperature
KW  - time division multiplexing
KW  - AlMn
KW  - South Pole telescope
KW  - TES sensor
KW  - X-ray microcalorimeter
KW  - bulk effect
KW  - cosmic microwave background polarimeter
KW  - film thickness
KW  - frequency division multiplexing
KW  - read-out
KW  - standard bilayer
KW  - superconducting density
KW  - superconducting film
KW  - superconducting transition edge sensor
KW  - time division SQUID multiplexing
KW  - transition temperature
KW  - Bandwidth
KW  - Detectors
KW  - Frequency division multiplexing
KW  - Manganese
KW  - Refrigerators
KW  - Temperature measurement
KW  - AlMn
KW  - polarimeter
KW  - transition-edge sensor
DO  - 10.1109/TASC.2010.2090313
JO  - IEEE Transactions on Applied Superconductivity
IS  - 3
SN  - 1051-8223
VO  - 21
VL  - 21
JA  - IEEE Transactions on Applied Superconductivity
Y1  - June 2011
ER  - 

TY  - CONF
TI  - Calibration of a thermal transfer standard using a pulse-driven Josephson voltage standard at frequencies up to 100 kHz
T2  - 29th Conference on Precision Electromagnetic Measurements (CPEM 2014)
SP  - 54
EP  - 55
AU  - T. Hagen
AU  - Y. h. Tang
AU  - T. E. Lipe
PY  - 2014
KW  - Josephson effect
KW  - calibration
KW  - inductance
KW  - measurement errors
KW  - measurement standards
KW  - voltage measurement
KW  - Josephson array
KW  - ac-dc thermal transfer standards
KW  - calibration
KW  - frequency 10 kHz to 100 kHz
KW  - on-chip inductance
KW  - pulse-driven Josephson voltage standard
KW  - systematic error
KW  - Arrays
KW  - Calibration
KW  - Coaxial cables
KW  - Generators
KW  - Radio frequency
KW  - Standards
KW  - Voltage measurement
KW  - Josephson arrays
KW  - ac-dc transfer
KW  - measurement techniques pulse driven Josephson junctions
KW  - thermal transfer standards
DO  - 10.1109/CPEM.2014.6898255
JO  - 29th Conference on Precision Electromagnetic Measurements (CPEM 2014)
IS  - 
SN  - 0589-1485
VO  - 
VL  - 
JA  - 29th Conference on Precision Electromagnetic Measurements (CPEM 2014)
Y1  - 24-29 Aug. 2014
ER  - 

TY  - CONF
TI  - Characterization and resistive switching properties of solution-processed HfO<inf>2</inf>, HfSiO<inf>4</inf>, and ZrSiO<inf>4</inf> thin films on rigid and flexible substrates
T2  - 2011 International Semiconductor Device Research Symposium (ISDRS)
SP  - 1
EP  - 2
AU  - J. L. Tedesco
AU  - W. Zheng
AU  - O. A. Kirillov
AU  - S. Pookpanratana
AU  - H. J. Jang
AU  - P. P. Kavuri
AU  - N. V. Nguyen
AU  - C. A. Richter
PY  - 2011
KW  - X-ray photoelectron spectra
KW  - dielectric thin films
KW  - electrical resistivity
KW  - ellipsometry
KW  - hafnium compounds
KW  - memristors
KW  - optical microscopy
KW  - sol-gel processing
KW  - ultraviolet spectra
KW  - vacuum deposition
KW  - zirconium compounds
KW  - HfO<sub>2</sub>
KW  - HfSiO<sub>4</sub>
KW  - Si
KW  - X-ray photoelectron spectroscopy
KW  - XPS
KW  - ZrSiO<sub>4</sub>
KW  - capacitance-frequency measurement
KW  - capacitance-voltage measurement
KW  - conductance- frequency measurement
KW  - current-voltage measurement
KW  - deep ultraviolet spectroscopic ellipsometry
KW  - dielectric films
KW  - flexible polyethylene teraphthalate substrates
KW  - memristors
KW  - optical microscopy
KW  - optical profilometry
KW  - resistive switching properties
KW  - silicon substrates
KW  - sol-gel synthesis
KW  - solution-processed thin films
KW  - temperature 293 K to 298 K
KW  - thermally evaporated aluminum contacts
KW  - Memristors
KW  - Optical device fabrication
KW  - Optical films
KW  - Optical imaging
KW  - Optical switches
KW  - Substrates
DO  - 10.1109/ISDRS.2011.6135416
JO  - 2011 International Semiconductor Device Research Symposium (ISDRS)
IS  - 
SN  - 
VO  - 
VL  - 
JA  - 2011 International Semiconductor Device Research Symposium (ISDRS)
Y1  - 7-9 Dec. 2011
ER  - 

TY  - JOUR
TI  - Attenuation in superconducting striplines
T2  - IEEE Transactions on Magnetics
SP  - 566
EP  - 569
AU  - R. Kautz
PY  - 1979
KW  - Stripline
KW  - Superconducting devices
KW  - Attenuation
KW  - Capacitors
KW  - Coaxial components
KW  - Dielectric measurements
KW  - Frequency
KW  - Niobium
KW  - Q measurement
KW  - Stripline
KW  - Strips
KW  - Superconducting transition temperature
DO  - 10.1109/TMAG.1979.1060166
JO  - IEEE Transactions on Magnetics
IS  - 1
SN  - 0018-9464
VO  - 15
VL  - 15
JA  - IEEE Transactions on Magnetics
Y1  - Jan 1979
ER  - 

TY  - JOUR
TI  - Justification for neglecting the compressibility of the ionosphere in VLF radio propagation
T2  - IEEE Transactions on Antennas and Propagation
SP  - 480
EP  - 481
AU  - J. Wait
PY  - 1965
KW  - Ionospheric propagation
KW  - VLF radio propagation
KW  - Acoustic propagation
KW  - Acoustic waves
KW  - Apertures
KW  - Geometry
KW  - Ionosphere
KW  - Lighting
KW  - Optical resonators
KW  - Optical surface waves
KW  - Plasma waves
KW  - Radio propagation
DO  - 10.1109/TAP.1965.1138447
JO  - IEEE Transactions on Antennas and Propagation
IS  - 3
SN  - 0018-926X
VO  - 13
VL  - 13
JA  - IEEE Transactions on Antennas and Propagation
Y1  - May 1965
ER  - 

TY  - JOUR
TI  - About the cover
T2  - IEEE Magnetics Letters
SP  - C4
EP  - C4
AU  - —. Goldfarb (<inlinegraphic graphicformat="EPS" xlink:type="simple" fileref="8. eps" xmlns:xlink="http://www. w3. org/1999/xlink"/>)
PY  - 2014
DO  - 10.1109/LMAG.2013.2290276
JO  - IEEE Magnetics Letters
IS  - 
SN  - 1949-307X
VO  - 5
VL  - 5
JA  - IEEE Magnetics Letters
Y1  - 2014
ER  - 

TY  - CONF
TI  - Single photon source characterization with a superconducting single photon detector
T2  - 2006 Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference
SP  - 1
EP  - 2
AU  - R. H. Hadfield
AU  - M. J. Stevens
AU  - S. S. Gruber
AU  - A. J. Miller
AU  - R. E. Schwall
AU  - R. P. Mirin
AU  - Sae Woo Nam
PY  - 2006
KW  - infrared spectra
KW  - jitter
KW  - superconducting photodetectors
KW  - timing
KW  - FWHM jitter
KW  - infrared spectra
KW  - single photon source
KW  - superconducting single photon detector
KW  - timing resolution
KW  - Gas detectors
KW  - Heterojunction bipolar transistors
KW  - Indium gallium arsenide
KW  - Infrared detectors
KW  - Jitter
KW  - Optical interferometry
KW  - Photonics
KW  - Quantum dots
KW  - Refrigeration
KW  - Superconducting photodetectors
KW  - (230.5160) Photodetectors
KW  - (250.5570) Photoluminescence
KW  - (270.5570) Quantum Detectors
DO  - 10.1109/CLEO.2006.4628701
JO  - 2006 Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference
IS  - 
SN  - 
VO  - 
VL  - 
JA  - 2006 Conference on Lasers and Electro-Optics and 2006 Quantum Electronics and Laser Science Conference
Y1  - 21-26 May 2006
ER  - 

TY  - CONF
TI  - Perceptual Effects of Noise in Digital Video Compression
T2  - 140th SMPTE Technical Conference and Exhibit
SP  - 1
EP  - 17
AU  - C. Fenimore
AU  - J. Libert
AU  - S. Wolf
PY  - 1998
DO  - 10.5594/M00301
JO  - 140th SMPTE Technical Conference and Exhibit
IS  - 
SN  - 
VO  - 
VL  - 
JA  - 140th SMPTE Technical Conference and Exhibit
Y1  - 28-31 Oct. 1998
ER  - 

TY  - JOUR
TI  - Pulse and time-domain measurements
T2  - Proceedings of the IEEE
SP  - 77
EP  - 81
AU  - R. A. Lawton
AU  - S. M. Riad
AU  - J. R. Andrews
PY  - 1986
KW  - Counting circuits
KW  - Distortion measurement
KW  - Measurement standards
KW  - Oscilloscopes
KW  - Pulse measurements
KW  - Sampling methods
KW  - Signal analysis
KW  - Standards development
KW  - Time domain analysis
KW  - Time measurement
DO  - 10.1109/PROC.1986.13406
JO  - Proceedings of the IEEE
IS  - 1
SN  - 0018-9219
VO  - 74
VL  - 74
JA  - Proceedings of the IEEE
Y1  - Jan. 1986
ER  - 

TY  - JOUR
TI  - Radio Observations of the Bureau of Standards during the Solar Eclipse of August 31, 1932
T2  - Proceedings of the Institute of Radio Engineers
SP  - 247
EP  - 264
AU  - S. S. Kirby
AU  - L. V. Berkner
AU  - T. R. Gilliland
AU  - K. A. Norton
PY  - 1934
KW  - Atmosphere
KW  - Atomic measurements
KW  - Frequency measurement
KW  - Ionization
KW  - Ionizing radiation
KW  - Ionosphere
KW  - Particle tracking
KW  - Standards publication
KW  - Sun
KW  - US Department of Commerce
DO  - 10.1109/JRPROC.1934.227896
JO  - Proceedings of the Institute of Radio Engineers
IS  - 2
SN  - 0731-5996
VO  - 22
VL  - 22
JA  - Proceedings of the Institute of Radio Engineers
Y1  - Feb. 1934
ER  - 

TY  - CONF
TI  - Thermal degradation of high polymers
T2  - 1952 Conference on Electrical Insulation
SP  - 23
EP  - 24
AU  - F. W. Reinhart
PY  - 1952
KW  - polymers
KW  - pyrolysis
KW  - thermal stability
KW  - GE-S rubber
KW  - polyethylene
KW  - polymers
KW  - polyvinyl chloride
KW  - thermal degradation
KW  - Chemicals
KW  - Compounds
KW  - Conductivity
KW  - Degradation
KW  - Hydrocarbons
KW  - Ions
KW  - Polyethylene
DO  - 10.1109/CEI.1952.7541078
JO  - 1952 Conference on Electrical Insulation
IS  - 
SN  - 
VO  - 
VL  - 
JA  - 1952 Conference on Electrical Insulation
Y1  - 2-4 Oct. 1952
ER  - 

TY  - CONF
TI  - Traceability of high-speed electrical waveforms at NIST, NPL, and PTB
T2  - 2012 Conference on Precision electromagnetic Measurements
SP  - 522
EP  - 523
AU  - P. D. Hale
AU  - D. F. Williams
AU  - A. Dienstfrey
AU  - J. Wang
AU  - J. Jargon
AU  - D. Humphreys
AU  - M. Harper
AU  - H. Füser
AU  - M. Bieler
PY  - 2012
KW  - calibration
KW  - electric variables measurement
KW  - oscilloscopes
KW  - signal processing equipment
KW  - signal sampling
KW  - NIST
KW  - NPL
KW  - PTB
KW  - electro-optic sampling
KW  - full waveform metrology
KW  - high speed electrical waveform
KW  - high speed waveform measurement
KW  - measurement services
KW  - traceable calibration chain
KW  - Calibration
KW  - Coplanar waveguides
KW  - Electrooptical waveguides
KW  - Measurement by laser beam
KW  - NIST
KW  - Oscilloscopes
KW  - Uncertainty
KW  - Electro-optic sampling
KW  - metrology
KW  - oscilloscope
KW  - photodetector
KW  - pulse
KW  - ultrafast
KW  - uncertainty
KW  - waveform
DO  - 10.1109/CPEM.2012.6251033
JO  - 2012 Conference on Precision electromagnetic Measurements
IS  - 
SN  - 0589-1485
VO  - 
VL  - 
JA  - 2012 Conference on Precision electromagnetic Measurements
Y1  - 1-6 July 2012
ER  - 

TY  - JOUR
TI  - Definitions of v, i, Z, Y, a, b, &#915;, and S
T2  - Proceedings of the IEEE
SP  - 892
EP  - 900
AU  - D. M. Kerns
PY  - 1967
KW  - Boundary conditions
KW  - Conductors
KW  - Electromagnetic fields
KW  - Electromagnetic waveguides
KW  - Hollow waveguides
KW  - NIST
KW  - Propagation constant
KW  - Waveguide components
KW  - Waveguide theory
KW  - Waveguide transitions
DO  - 10.1109/PROC.1967.5704
JO  - Proceedings of the IEEE
IS  - 6
SN  - 0018-9219
VO  - 55
VL  - 55
JA  - Proceedings of the IEEE
Y1  - June 1967
ER  - 

TY  - JOUR
TI  - Electronic vector-network-analyzer verification [Application Notes]
T2  - IEEE Microwave Magazine
SP  - 118
EP  - 123
AU  - D. Williams
AU  - A. Lewandowski
AU  - D. Legolvan
AU  - R. Ginley
PY  - 2009
KW  - Internet
KW  - calibration
KW  - computerised instrumentation
KW  - microwave devices
KW  - network analysers
KW  - Internet
KW  - NIST
KW  - NIST servers
KW  - National Institute of Standards and Technology
KW  - VeridiCal software
KW  - computer-controlled electronic verification artifact
KW  - electronic vector-network-analyzer verification
KW  - microwave vector-network-analyzer
KW  - record keeping
KW  - verification report generation
KW  - Accuracy
KW  - Calibration
KW  - Data analysis
KW  - Impedance
KW  - NIST
KW  - Performance analysis
KW  - Performance evaluation
KW  - Software measurement
KW  - Software performance
DO  - 10.1109/MMM.2009.933595
JO  - IEEE Microwave Magazine
IS  - 6
SN  - 1527-3342
VO  - 10
VL  - 10
JA  - IEEE Microwave Magazine
Y1  - Oct. 2009
ER  - 

TY  - CONF
TI  - LRM Probe-Tip Calibrations with Imperfect Resistors and Lossy Lines
T2  - 42nd ARFTG Conference Digest
SP  - 32
EP  - 36
AU  - D. F. Williams
AU  - R. B. Marks
PY  - 1993
KW  - Calibration
KW  - Integrated circuit measurements
KW  - Loss measurement
KW  - MMICs
KW  - Measurement standards
KW  - Microwave integrated circuits
KW  - Microwave measurements
KW  - Monolithic integrated circuits
KW  - Resistors
KW  - Wideband
DO  - 10.1109/ARFTG.1993.327038
JO  - 42nd ARFTG Conference Digest
IS  - 
SN  - 
VO  - 24
VL  - 24
JA  - 42nd ARFTG Conference Digest
Y1  - Dec. 1993
ER  - 

TY  - CONF
TI  - Electromigration discussion group summary
T2  - 2001 IEEE International Integrated Reliability Workshop. Final Report (Cat. No.01TH8580)
SP  - 97
EP  - 97
AU  - H. A. Schafft
PY  - 2001
KW  - Circuit testing
KW  - Copper
KW  - Electromigration
KW  - Extrapolation
KW  - Failure analysis
KW  - Guidelines
KW  - Integrated circuit interconnections
KW  - Maintenance
KW  - NIST
KW  - Stress
DO  - 10.1109/IRWS.2001.993928
JO  - 2001 IEEE International Integrated Reliability Workshop. Final Report (Cat. No.01TH8580)
IS  - 
SN  - 
VO  - 
VL  - 
JA  - 2001 IEEE International Integrated Reliability Workshop. Final Report (Cat. No.01TH8580)
Y1  - 2001
ER  - 

TY  - CONF
TI  - Polarizability of an optical lattice clock at 20 ppm
T2  - 2012 Conference on Precision electromagnetic Measurements
SP  - 274
EP  - 275
AU  - J. A. Sherman
AU  - N. D. Lemke
AU  - N. Hinkley
AU  - R. W. Fox
AU  - A. D. Ludlow
AU  - C. W. Oates
PY  - 2012
KW  - atom-photon collisions
KW  - atomic clocks
KW  - blackbody radiation
KW  - laser frequency stability
KW  - laser transitions
KW  - measurement uncertainty
KW  - optical lattices
KW  - polarisability
KW  - radiation pressure
KW  - ytterbium
KW  - Yb
KW  - absolute electric field generation
KW  - electrode design
KW  - external electric fields
KW  - frequency stability
KW  - frequency uncertainty
KW  - highly-forbidden transitions
KW  - neutral optical atomic clocks
KW  - optical lattice clock
KW  - polarizability
KW  - room-temperature blackbody radiation
KW  - standing-wave optical potentials
KW  - temperature 293 K to 298 K
KW  - ultracold alkaline-earth atoms
KW  - ytterbium clock frequency
KW  - ytterbium optical lattice clock
KW  - Atom optics
KW  - Atomic clocks
KW  - Atomic measurements
KW  - Electrodes
KW  - Lattices
KW  - Optical variables measurement
KW  - Atomic measurements
KW  - Stark effect
KW  - blackbody radiation
KW  - clocks
KW  - electric fields
KW  - polarizability
KW  - precision measurements
DO  - 10.1109/CPEM.2012.6250908
JO  - 2012 Conference on Precision electromagnetic Measurements
IS  - 
SN  - 0589-1485
VO  - 
VL  - 
JA  - 2012 Conference on Precision electromagnetic Measurements
Y1  - 1-6 July 2012
ER  - 

TY  - JOUR
TI  - Guarding techniques for resistance thermometers
T2  - IEEE Transactions on Instrumentation and Measurement
SP  - 217
EP  - 220
AU  - R. D. Cutkosky
PY  - 1981
KW  - protection
KW  - resistance thermometers
KW  - bridges
KW  - electrical guards
KW  - protection
KW  - resistance thermometers
KW  - Bridge circuits
KW  - Bridges
KW  - Electrical resistance measurement
KW  - Furnaces
KW  - Operational amplifiers
KW  - Resistance
KW  - Temperature measurement
DO  - 10.1109/TIM.1981.6312382
JO  - IEEE Transactions on Instrumentation and Measurement
IS  - 3
SN  - 0018-9456
VO  - IM-30
VL  - IM-30
JA  - IEEE Transactions on Instrumentation and Measurement
Y1  - Sept. 1981
ER  - 

TY  - JOUR
TI  - Guest Editorial Special Section on Cyber-Physical Systems and Security for Smart Grid
T2  - IEEE Transactions on Smart Grid
SP  - 2405
EP  - 2408
AU  - H. Gharavi
AU  - H. H. Chen
AU  - C. Wietfeld
PY  - 2015
KW  - Cyber-physical systems
KW  - Microgrids
KW  - Phasor measurement units
KW  - Privacy
KW  - Security
KW  - Special issues and sections
DO  - 10.1109/TSG.2015.2464911
JO  - IEEE Transactions on Smart Grid
IS  - 5
SN  - 1949-3053
VO  - 6
VL  - 6
JA  - IEEE Transactions on Smart Grid
Y1  - Sept. 2015
ER  - 

TY  - CONF
TI  - Fabrication of High Anisotropy Nanoscale Patterned Magnetic Recording Medium for Data Storage Applications
T2  - INTERMAG 2006 - IEEE International Magnetics Conference
SP  - 945
EP  - 945
AU  - V. A. Parekh
AU  - C. E
AU  - D. Smith
AU  - A. Ruiz
AU  - J. C. Wolfe
AU  - P. Ruchhoeft
AU  - E. Svedberg
AU  - S. Khizroev
AU  - D. Litvinov
PY  - 2006
KW  - ion beam lithography
KW  - magnetic anisotropy
KW  - magnetic recording
KW  - magnetic storage
KW  - nanopatterning
KW  - proximity effect (lithography)
KW  - data storage
KW  - ion beam proximity lithography
KW  - magnetic anisotropy
KW  - media patterning
KW  - nanoscale patterned magnetic recording medium
KW  - Anisotropic magnetoresistance
KW  - Fabrication
KW  - Lithography
KW  - Magnetic anisotropy
KW  - Magnetic films
KW  - Magnetic materials
KW  - Magnetic recording
KW  - Memory
KW  - Perpendicular magnetic anisotropy
KW  - Silicon
DO  - 10.1109/INTMAG.2006.374976
JO  - INTERMAG 2006 - IEEE International Magnetics Conference
IS  - 
SN  - 2150-4598
VO  - 
VL  - 
JA  - INTERMAG 2006 - IEEE International Magnetics Conference
Y1  - 8-12 May 2006
ER  - 

TY  - JOUR
TI  - A Precision RF Power Transfer Standard
T2  - IRE Transactions on Instrumentation
SP  - 280
EP  - 283
AU  - P. A. Hudson
PY  - 1960
KW  - Attenuators
KW  - Calibration
KW  - Directional couplers
KW  - Impedance
KW  - Laboratories
KW  - Measurement standards
KW  - Power measurement
KW  - Radio frequency
KW  - Switches
KW  - Voltage
DO  - 10.1109/IRE-I.1960.5006930
JO  - IRE Transactions on Instrumentation
IS  - 2
SN  - 0096-2260
VO  - I-9
VL  - I-9
JA  - IRE Transactions on Instrumentation
Y1  - Sept. 1960
ER  - 

TY  - JOUR
TI  - The Power Spectrum and Its Importance in Precise Frequency Measurements
T2  - IRE Transactions on Instrumentation
SP  - 149
EP  - 155
AU  - J. A. Barnes
AU  - R. C. Mockler
PY  - 1960
KW  - Atomic measurements
KW  - Bandwidth
KW  - Filters
KW  - Frequency measurement
KW  - Instruments
KW  - Masers
KW  - NIST
KW  - Power measurement
KW  - Radiation detectors
KW  - Resonance
DO  - 10.1109/IRE-I.1960.5006906
JO  - IRE Transactions on Instrumentation
IS  - 2
SN  - 0096-2260
VO  - I-9
VL  - I-9
JA  - IRE Transactions on Instrumentation
Y1  - Sept. 1960
ER  - 

TY  - CONF
TI  - Performance Barriers To High Speed Networks
T2  - LEOS 1993 Summer Topical Meeting Digest on Optical Microwave Interactions/Visible Semiconductor Lasers/Impact of Fiber Nonlinearities on Lightwave Systems/Hybrid Optoelectronic Integration and Packagi
SP  - G32
EP  - G33
AU  - A. Mink
AU  - Y. Fouquet
AU  - S. Wakid
PY  - 1993
KW  - Bandwidth
KW  - Ethernet networks
KW  - High-speed networks
KW  - Jacobian matrices
KW  - Kernel
KW  - NIST
KW  - Operating systems
KW  - Probes
KW  - Protocols
KW  - Throughput
DO  - 10.1109/LEOSST.1993.696912
JO  - LEOS 1993 Summer Topical Meeting Digest on Optical Microwave Interactions/Visible Semiconductor Lasers/Impact of Fiber Nonlinearities on Lightwave Systems/Hybrid Optoelectronic Integration and Packagi
IS  - 
SN  - 
VO  - 
VL  - 
JA  - LEOS 1993 Summer Topical Meeting Digest on Optical Microwave Interactions/Visible Semiconductor Lasers/Impact of Fiber Nonlinearities on Lightwave Systems/Hybrid Optoelectronic Integration and Packagi
Y1  - 19-21 July 1993
ER  - 

TY  - JOUR
TI  - Radioactive Standards and Methods of Testing Instruments Used in the Measurement of Radioactivity
T2  - Proceedings of the IRE
SP  - 913
EP  - 922
AU  - L. F. Curtiss
PY  - 1949
KW  - Calibration
KW  - Instruments
KW  - Isotopes
KW  - Measurement standards
KW  - NIST
KW  - Particle measurements
KW  - Production
KW  - Radioactive materials
KW  - Standardization
KW  - Testing
DO  - 10.1109/JRPROC.1949.229984
JO  - Proceedings of the IRE
IS  - 8
SN  - 0096-8390
VO  - 37
VL  - 37
JA  - Proceedings of the IRE
Y1  - Aug. 1949
ER  - 

TY  - JOUR
TI  - A Study of Air Gap Breakdown at 28.5 Kilohertz
T2  - IEEE Power Engineering Review
SP  - 63
EP  - 64
AU  - F. R. Kotter
AU  - A. N. Smith
PY  - 1983
KW  - Breakdown voltage
KW  - Economic forecasting
KW  - Electric breakdown
KW  - Electrodes
KW  - Frequency
KW  - Humidity
KW  - IEC standards
KW  - Shape control
KW  - Space charge
KW  - Valves
DO  - 10.1109/MPER.1983.5519067
JO  - IEEE Power Engineering Review
IS  - 6
SN  - 0272-1724
VO  - PER-3
VL  - PER-3
JA  - IEEE Power Engineering Review
Y1  - June 1983
ER  - 

TY  - CONF
TI  - Extreme useful range of VHF transmission by scattering from the lower ionosphere
T2  - 1958 IRE International Convention Record
SP  - 112
EP  - 120
AU  - R. Kirby
PY  - 1958
KW  - Apertures
KW  - Delay effects
KW  - Fading
KW  - Geometry
KW  - Ionization
KW  - Ionosphere
KW  - Polarization
KW  - Q factor
KW  - Receiving antennas
KW  - Scattering
DO  - 10.1109/IRECON.1958.1150713
JO  - 1958 IRE International Convention Record
IS  - 
SN  - 
VO  - 6
VL  - 6
JA  - 1958 IRE International Convention Record
Y1  - 21-25 March 1966
ER  - 

TY  - JOUR
TI  - Wideband IF-Integrated Terahertz HEB Mixers: Modeling and Characterization
T2  - IEEE Transactions on Microwave Theory and Techniques
SP  - 1140
EP  - 1150
AU  - F. Rodriguez-Morales
AU  - K. S. Yngvesson
AU  - D. Gu
PY  - 2010
KW  - MMIC
KW  - bolometers
KW  - hot carriers
KW  - oscillators
KW  - DC bias
KW  - IF properties
KW  - IF small-signal output impedance
KW  - broadband technique
KW  - computer-aided design model
KW  - integrated receivers
KW  - local oscillator illumination
KW  - monolithic micorwave integrated circuit IF amplifier
KW  - network analyzer measurement
KW  - phonon-cooled NbN hot electron bolometer terahertz mixers
KW  - phonon-cooled NbN hot electron bolometer terahertz receivers
KW  - wideband IF-integrated terahertz HEB mixers
KW  - Submillimeter-wave detectors
KW  - submillimeter-wave mixers
KW  - submillimeter-wave receivers
DO  - 10.1109/TMTT.2010.2045566
JO  - IEEE Transactions on Microwave Theory and Techniques
IS  - 5
SN  - 0018-9480
VO  - 58
VL  - 58
JA  - IEEE Transactions on Microwave Theory and Techniques
Y1  - May 2010
ER  - 

TY  - CONF
TI  - Diffusion of copper into gold plating
T2  - 1993 IEEE Instrumentation and Measurement Technology Conference
SP  - 114
EP  - 117
AU  - S. P. Pucic
PY  - 1993
KW  - Auger effect
KW  - chemical interdiffusion
KW  - copper
KW  - electrical resistivity
KW  - electron spectroscopy
KW  - electroplating
KW  - gold
KW  - skin effect
KW  - Auger electron spectroscopy
KW  - Cu-Au
KW  - Cu<sub>2</sub>O
KW  - Ni diffusion
KW  - clean atmosphere
KW  - electrical resistivity
KW  - ferromagnetism
KW  - high-temperature measurements
KW  - interdiffusion coefficient
KW  - microwave
KW  - millimeter-wave applications
KW  - room temperature
KW  - skin depth
KW  - Conductivity
KW  - Copper
KW  - Electric resistance
KW  - Electromagnetic propagation
KW  - Electrons
KW  - Gold
KW  - Nickel
KW  - Skin
KW  - Spectroscopy
KW  - Temperature
DO  - 10.1109/IMTC.1993.382669
JO  - 1993 IEEE Instrumentation and Measurement Technology Conference
IS  - 
SN  - 
VO  - 
VL  - 
JA  - 1993 IEEE Instrumentation and Measurement Technology Conference
Y1  - 18-20 May 1993
ER  - 

TY  - JOUR
TI  - The Role of High-Field Stress in the Negative-Bias Temperature Instability
T2  - IEEE Transactions on Device and Materials Reliability
SP  - 482
EP  - 491
AU  - J. P. Campbell
AU  - K. P. Cheung
AU  - J. S. Suehle
AU  - A. S. Oates
PY  - 2010
KW  - stress analysis
KW  - transistors
KW  - dielectric fields
KW  - drain-current measurements
KW  - excessive degradation
KW  - fast drain-current measurement
KW  - high-field stress
KW  - latent electron detrapping
KW  - latent electron trapping
KW  - negative-bias temperature instability
KW  - production quality transistors
KW  - standard threshold voltage
KW  - transconductance extractions
KW  - Electron trapping
KW  - high-field stress
KW  - hole trapping
KW  - negative-bias temperature instability (NBTI)
DO  - 10.1109/TDMR.2010.2064314
JO  - IEEE Transactions on Device and Materials Reliability
IS  - 4
SN  - 1530-4388
VO  - 10
VL  - 10
JA  - IEEE Transactions on Device and Materials Reliability
Y1  - Dec. 2010
ER  - 

TY  - CONF
TI  - The extraction of topographic features in support of autonomous underwater vehicle navigation
T2  - Proceedings of the 1987 5th International Symposium on Unmanned Untethered Submersible Technology
SP  - 502
EP  - 514
AU  - D. Orser
AU  - M. Roche
PY  - 1987
KW  - Data mining
KW  - Feature extraction
KW  - Lakes
KW  - Navigation
KW  - Sensor phenomena and characterization
KW  - Space technology
KW  - Surface fitting
KW  - Surface reconstruction
KW  - Surface topography
KW  - Underwater vehicles
DO  - 10.1109/UUST.1987.1158571
JO  - Proceedings of the 1987 5th International Symposium on Unmanned Untethered Submersible Technology
IS  - 
SN  - 
VO  - 5
VL  - 5
JA  - Proceedings of the 1987 5th International Symposium on Unmanned Untethered Submersible Technology
Y1  - Jun 1987
ER  - 

TY  - JOUR
TI  - Dynamic Circuit Techniques Used in SEAC and DYSEAC
T2  - Proceedings of the IRE
SP  - 1380
EP  - 1387
AU  - R. D. Elbourn
AU  - R. P. Witt
PY  - 1953
KW  - Diodes
KW  - Germanium
KW  - Logic circuits
KW  - NIST
KW  - Packaging
KW  - Pulse amplifiers
KW  - Pulse circuits
KW  - Pulse inverters
KW  - Pulse transformers
KW  - Switching circuits
DO  - 10.1109/JRPROC.1953.274314
JO  - Proceedings of the IRE
IS  - 10
SN  - 0096-8390
VO  - 41
VL  - 41
JA  - Proceedings of the IRE
Y1  - Oct. 1953
ER  - 

TY  - CONF
TI  - Fast-capacitance for advanced device characterization
T2  - 2013 IEEE International Integrated Reliability Workshop Final Report
SP  - 26
EP  - 29
AU  - P. Shrestha
AU  - K. P. Cheung
AU  - J. P. Campbell
AU  - J. T. Ryan
AU  - H. Baumgart
PY  - 2013
KW  - capacitance measurement
KW  - reliability
KW  - advanced device characterization
KW  - fast CV measurement
KW  - fast-capacitance
KW  - reliability measurements
KW  - Capacitance
KW  - Capacitance measurement
KW  - Current measurement
KW  - Logic gates
KW  - Transient analysis
KW  - Velocity measurement
KW  - Voltage measurement
KW  - Fast-CV
KW  - capacitance measurements
KW  - transient characterization
DO  - 10.1109/IIRW.2013.6804147
JO  - 2013 IEEE International Integrated Reliability Workshop Final Report
IS  - 
SN  - 1930-8841
VO  - 
VL  - 
JA  - 2013 IEEE International Integrated Reliability Workshop Final Report
Y1  - 13-17 Oct. 2013
ER  - 

TY  - JOUR
TI  - Reliability Characterization of Au&#x2013;In Transient Liquid Phase Bonding Through Electrical Resistivity Measurement
T2  - IEEE Transactions on Components, Packaging and Manufacturing Technology
SP  - 1726
EP  - 1733
AU  - B. J. Grummel
AU  - H. A. Mustain
AU  - Z. J. Shen
AU  - J. C. Elmes
AU  - A. R. Hefner
PY  - 2015
KW  - X-ray chemical analysis
KW  - X-ray spectroscopy
KW  - electrical resistivity
KW  - focused ion beam technology
KW  - microassembling
KW  - scanning electron microscopes
KW  - semiconductor device measurement
KW  - semiconductor device packaging
KW  - semiconductor device reliability
KW  - Au-In
KW  - TLP die-attach bonding
KW  - barrier layers
KW  - electrical resistivity measurement
KW  - energy dispersive X-ray spectroscopy
KW  - focused ion beam
KW  - high-temperature semiconductor device packaging
KW  - material diffusion
KW  - scanning electron microscope
KW  - temperature 200 degC
KW  - thermal cycling
KW  - transient liquid phase bonding
KW  - Conductivity
KW  - Diffusion processes
KW  - Electronics cooling
KW  - Materials reliability
KW  - Semiconductor device packaging
KW  - Wafer bonding
KW  - Diffusion process
KW  - Electronics cooling
KW  - SLID
KW  - Semiconductor device packaging
KW  - Solid-liquid interdiffusion
KW  - TLP
KW  - Transient Liquid Phase Bonding
KW  - Wafer bonding
KW  - Wafer bonding.
DO  - 10.1109/TCPMT.2015.2489686
JO  - IEEE Transactions on Components, Packaging and Manufacturing Technology
IS  - 12
SN  - 2156-3950
VO  - 5
VL  - 5
JA  - IEEE Transactions on Components, Packaging and Manufacturing Technology
Y1  - Dec. 2015
ER  - 

TY  - JOUR
TI  - 3-D Thermal Component Model for Electrothermal Analysis of Multichip Power Modules With Experimental Validation
T2  - IEEE Transactions on Power Electronics
SP  - 3300
EP  - 3308
AU  - J. Reichl
AU  - J. M. Ortiz-Rodríguez
AU  - A. Hefner
AU  - J. S. Lai
PY  - 2015
KW  - Fourier series
KW  - finite difference methods
KW  - heat conduction
KW  - multichip modules
KW  - power semiconductor devices
KW  - thermal analysis
KW  - 3D thermal component model
KW  - DBC substrates
KW  - FDM thermal model
KW  - Fourier series-based model
KW  - TSP
KW  - asymmetrical power distributions
KW  - direct bond copper
KW  - electrothermal analysis
KW  - electrothermal simulation
KW  - finite difference methods
KW  - heat conduction equation
KW  - multichip power modules
KW  - multichip thermal component model
KW  - temperature-sensitive parameter
KW  - thermal transient
KW  - transient coupling measurement technique
KW  - Equations
KW  - Frequency division multiplexing
KW  - Heating
KW  - Materials
KW  - Mathematical model
KW  - Solid modeling
KW  - Thermal conductivity
KW  - Compact thermal model
KW  - component thermal model
KW  - electrothermal
KW  - multichip modules
KW  - soft switching inverter
DO  - 10.1109/TPEL.2014.2338278
JO  - IEEE Transactions on Power Electronics
IS  - 6
SN  - 0885-8993
VO  - 30
VL  - 30
JA  - IEEE Transactions on Power Electronics
Y1  - June 2015
ER  - 

TY  - CONF
TI  - Using chebyshev polynomials for interpreting structured light images
T2  - Proceedings. 1985 IEEE International Conference on Robotics and Automation
SP  - 17
EP  - 20
AU  - M. Shneier
AU  - W. Rutkowski
AU  - Tsai-Hong Hong
PY  - 1985
KW  - Chebyshev approximation
KW  - Image segmentation
KW  - Noise figure
KW  - Pixel
KW  - Polynomials
KW  - Radio access networks
KW  - Runtime
KW  - Skeleton
KW  - Sufficient conditions
DO  - 10.1109/ROBOT.1985.1087361
JO  - Proceedings. 1985 IEEE International Conference on Robotics and Automation
IS  - 
SN  - 
VO  - 2
VL  - 2
JA  - Proceedings. 1985 IEEE International Conference on Robotics and Automation
Y1  - Mar 1985
ER  - 

TY  - CONF
TI  - Mechanical stabilization of frequency combs from laser machined microrod-resonators
T2  - IEEE Photonics Conference 2012
SP  - 64
EP  - 65
AU  - P. Del'Haye
AU  - S. Papp
AU  - S. Diddams
PY  - 2012
KW  - laser cavity resonators
KW  - laser frequency stability
KW  - laser materials processing
KW  - frequency 33 GHz
KW  - frequency combs
KW  - laser machined microrod-resonators
KW  - mechanical stabilization
KW  - piezoelectric mechanical control
KW  - High speed optical techniques
KW  - Laser stability
KW  - Microcavities
KW  - Nonlinear optics
KW  - Optical feedback
KW  - Resonant frequency
DO  - 10.1109/IPCon.2012.6358490
JO  - IEEE Photonics Conference 2012
IS  - 
SN  - 1092-8081
VO  - 
VL  - 
JA  - IEEE Photonics Conference 2012
Y1  - 23-27 Sept. 2012
ER  - 

TY  - CONF
TI  - Moving boundary and photoelastic contributions to optomechanical coupling in GaAs microcavities
T2  - 2014 IEEE Photonics Conference
SP  - 338
EP  - 339
AU  - K. C. Balram
AU  - M. Davanço
AU  - K. Srinivasan
PY  - 2014
KW  - III-V semiconductors
KW  - gallium arsenide
KW  - micro-optics
KW  - microcavities
KW  - photoelasticity
KW  - GaAs
KW  - microcavities
KW  - microdisks
KW  - moving boundary contributions
KW  - nanobeam optomechanical crystal geometries
KW  - optomechanical coupling
KW  - photoelastic contributions
KW  - Couplings
KW  - Crystals
KW  - Gallium arsenide
KW  - Optical coupling
KW  - Optical device fabrication
KW  - Optical resonators
KW  - Optical waveguides
DO  - 10.1109/IPCon.2014.6995382
JO  - 2014 IEEE Photonics Conference
IS  - 
SN  - 1092-8081
VO  - 
VL  - 
JA  - 2014 IEEE Photonics Conference
Y1  - 12-16 Oct. 2014
ER  - 

TY  - JOUR
TI  - Capacitor Calibration by Step-Up Methods
T2  - IRE Transactions on Component Parts
SP  - 124
EP  - 129
AU  - T. Zapf
PY  - 1960
KW  - Calibration
KW  - Capacitors
KW  - Electric variables measurement
KW  - Electrical resistance measurement
KW  - Length measurement
KW  - Magnetic materials
KW  - Magnetization
KW  - Measurement standards
KW  - NIST
KW  - Time measurement
DO  - 10.1109/TCP.1960.1136456
JO  - IRE Transactions on Component Parts
IS  - 4
SN  - 0096-2422
VO  - 7
VL  - 7
JA  - IRE Transactions on Component Parts
Y1  - Dec 1960
ER  - 

TY  - JOUR
TI  - Reliability of High-Voltage Molding Compounds: Particle Size, Curing Time, Sample Thickness, and Voltage Impact on Polarization
T2  - IEEE Transactions on Industrial Electronics
SP  - 7104
EP  - 7111
AU  - A. Garcia
AU  - N. Warner
AU  - N. A. D'Souza
AU  - E. Tuncer
AU  - L. Nguyen
AU  - M. Denison
AU  - J. T. Fong
PY  - 2016
KW  - composite materials
KW  - design of experiments
KW  - dielectric materials
KW  - graphical user interfaces
KW  - moulding
KW  - production engineering computing
KW  - reliability
KW  - DCM reliability
KW  - analytical computer software
KW  - charge entrapment
KW  - compound perspective
KW  - curing time
KW  - design of experiments
KW  - dielectric composite materials
KW  - graphic user interface tool
KW  - high-voltage molding compounds
KW  - intrinsic interfacial polarization
KW  - modern statistics
KW  - particle size
KW  - path length
KW  - polarization voltage magnitude
KW  - sample thickness
KW  - voltage impact
KW  - Compounds
KW  - Curing
KW  - Data analysis
KW  - Dielectrics
KW  - Materials reliability
KW  - Polymers
KW  - Design methodology
KW  - dielectric materials
KW  - dielectric polarization
KW  - reliability
KW  - thermally stimulated currents
DO  - 10.1109/TIE.2016.2585467
JO  - IEEE Transactions on Industrial Electronics
IS  - 11
SN  - 0278-0046
VO  - 63
VL  - 63
JA  - IEEE Transactions on Industrial Electronics
Y1  - Nov. 2016
ER  - 

TY  - JOUR
TI  - Guiding of electromagnetic waves by uniformly rough surfaces : Part I
T2  - IRE Transactions on Antennas and Propagation
SP  - 154
EP  - 162
AU  - J. Wait
PY  - 1959
KW  - Electromagnetic (EM) scattering by rough surfaces
KW  - Electromagnetic surface waves
KW  - Surface electromagnetic waves
KW  - Acoustic scattering
KW  - Conductivity
KW  - Corrugated surfaces
KW  - Electromagnetic reflection
KW  - Electromagnetic scattering
KW  - Rayleigh scattering
KW  - Rough surfaces
KW  - Surface acoustic waves
KW  - Surface roughness
KW  - Surface waves
DO  - 10.1109/TAP.1959.1144764
JO  - IRE Transactions on Antennas and Propagation
IS  - 5
SN  - 0096-1973
VO  - 7
VL  - 7
JA  - IRE Transactions on Antennas and Propagation
Y1  - December 1959
ER  - 

TY  - JOUR
TI  - Superconducting Detectors for Neutrino Mass Measurement
T2  - IEEE Transactions on Applied Superconductivity
SP  - 1
EP  - 4
AU  - M. Faverzani
AU  - D. Becker
AU  - D. Bennett
AU  - P. Day
AU  - P. Falferi
AU  - E. Ferri
AU  - J. Fowler
AU  - J. Gard
AU  - A. Giachero
AU  - C. Giordano
AU  - J. Hays-Wehle
AU  - G. Hilton
AU  - M. Maino
AU  - B. Margesin
AU  - J. Mates
AU  - R. Mezzena
AU  - R. Nizzolo
AU  - A. Nucciotti
AU  - A. Puiu
AU  - C. Reintsema
AU  - D. Schmidt
AU  - D. Swetz
AU  - J. Ullom
AU  - L. Vale
AU  - L. Zanetti
PY  - 2016
KW  - neutrino mass
KW  - particle calorimetry
KW  - superconducting devices
KW  - HOLMES experiment
KW  - absolute neutrino mass scale
KW  - astrophysics
KW  - calorimetric approach
KW  - calorimetric measurement
KW  - low temperature detectors
KW  - microwave frequency domain readout
KW  - microwave kinetic inductance detectors
KW  - microwave multiplexing system
KW  - multiplex factor
KW  - neutrino mass measurement
KW  - nuclear beta decay
KW  - particle physics
KW  - superconducting detectors
KW  - transition edge sensors
KW  - Detectors
KW  - Microwave theory and techniques
KW  - Multiplexing
KW  - Neutrino sources
KW  - Resonant frequency
KW  - SQUIDs
KW  - Holmium 163
KW  - Kinetic Inductance detectors
KW  - Neutrino mass
KW  - Transition Edge Sensors
KW  - kinetic inductance detectors
KW  - neutrino mass
KW  - transition edge sensors
DO  - 10.1109/TASC.2016.2540242
JO  - IEEE Transactions on Applied Superconductivity
IS  - 3
SN  - 1051-8223
VO  - 26
VL  - 26
JA  - IEEE Transactions on Applied Superconductivity
Y1  - April 2016
ER  - 

TY  - JOUR
TI  - Chirp Characterization of External Modulators With Finite Extinction Ratio Using Linear Optical Sampling
T2  - IEEE Photonics Technology Letters
SP  - 646
EP  - 648
AU  - T. Dennis
AU  - P. A. Williams
PY  - 2010
KW  - chirp modulation
KW  - extinction coefficients
KW  - optical fibre networks
KW  - optical modulation
KW  - ??-parameter waveforms
KW  - Mach-Zehnder modulator
KW  - chirp characterization
KW  - digital data modulation
KW  - external modulators
KW  - finite extinction ratio
KW  - frequency chirping
KW  - linear optical sampling
KW  - network monitoring
KW  - sinusoidal modulation
KW  - Chirp
KW  - coherent detection
KW  - linear optical sampling (LOS)
KW  - optical network monitoring
DO  - 10.1109/LPT.2010.2043356
JO  - IEEE Photonics Technology Letters
IS  - 9
SN  - 1041-1135
VO  - 22
VL  - 22
JA  - IEEE Photonics Technology Letters
Y1  - May1, 2010
ER  - 

TY  - CONF
TI  - Polarization-sensitive linear optical sampling for characterization of NRZ polarization-multiplexed QPSK
T2  - 2009 Conference on Optical Fiber Communication - incudes post deadline papers
SP  - 1
EP  - 3
AU  - P. A. Williams
AU  - T. Dennis
AU  - I. Coddington
AU  - N. R. Newbury
PY  - 2009
KW  - multiplexing
KW  - optical fibre communication
KW  - optical fibre polarisation
KW  - quadrature phase shift keying
KW  - NRZ polarization-multiplexed QPSK
KW  - high speed optical waveform
KW  - orthogonal polarization channel
KW  - polarization-sensitive linear optical sampling
KW  - Fiber nonlinear optics
KW  - High speed optical techniques
KW  - Optical fiber polarization
KW  - Optical modulation
KW  - Optical polarization
KW  - Optical sensors
KW  - Optical signal processing
KW  - Phase measurement
KW  - Quadrature phase shift keying
KW  - Sampling methods
KW  - (060.2330) Fiber optics communications
KW  - (320.7100) Ultrafast measurements
DO  - 10.1364/OFC.2009.OThH2
JO  - 2009 Conference on Optical Fiber Communication - incudes post deadline papers
IS  - 
SN  - 
VO  - 
VL  - 
JA  - 2009 Conference on Optical Fiber Communication - incudes post deadline papers
Y1  - 22-26 March 2009
ER  - 

TY  - JOUR
TI  - Mapping nonlinearities over the active regions of semiconductor devices
T2  - Proceedings of the IEEE
SP  - 1635
EP  - 1637
AU  - D. E. Sawyer
AU  - D. W. Berning
PY  - 1976
KW  - Frequency conversion
KW  - Frequency synchronization
KW  - Laser modes
KW  - Optical amplifiers
KW  - Optical modulation
KW  - Optical surface waves
KW  - Pain
KW  - Semiconductor devices
KW  - Semiconductor lasers
KW  - Silicon
DO  - 10.1109/PROC.1976.10393
JO  - Proceedings of the IEEE
IS  - 11
SN  - 0018-9219
VO  - 64
VL  - 64
JA  - Proceedings of the IEEE
Y1  - Nov. 1976
ER  - 

TY  - CONF
TI  - Forward and reverse link constraints in UHF RFID with passive tags
T2  - 2010 IEEE International Symposium on Electromagnetic Compatibility
SP  - 680
EP  - 685
AU  - D. G. Kuester
AU  - D. R. Novotny
AU  - J. R. Guerrieri
PY  - 2010
KW  - UHF circuits
KW  - passive networks
KW  - radio links
KW  - radiofrequency identification
KW  - backscattered fading
KW  - dipole
KW  - distance 2 m
KW  - forward link constraints
KW  - gain 8 dB
KW  - passive UHF RFID systems
KW  - passive tags
KW  - reverse link constraints
KW  - transmission power fading
KW  - Antenna measurements
KW  - Dipole antennas
KW  - Fading
KW  - Radiofrequency identification
KW  - Scattering
KW  - UHF measurements
DO  - 10.1109/ISEMC.2010.5711359
JO  - 2010 IEEE International Symposium on Electromagnetic Compatibility
IS  - 
SN  - 2158-110X
VO  - 
VL  - 
JA  - 2010 IEEE International Symposium on Electromagnetic Compatibility
Y1  - 25-30 July 2010
ER  -