{"indexed":{"date-parts":[[2018,4,30]],"date-time":"2018-04-30T05:02:30Z","timestamp":1525064550111},"reference-count":30,"publisher":"American Chemical Society (ACS)","issue":"20","content-domain":{"domain":[],"crossmark-restriction":false},"published-print":{"date-parts":[[1991,10,15]]},"DOI":"10.1021\/ac00020a024","type":"article-journal","created":{"date-parts":[[2005,3,16]],"date-time":"2005-03-16T18:42:58Z","timestamp":1110998578000},"page":"2329-2338","source":"Crossref","is-referenced-by-count":35,"title":"Achieving transferable multivariate spectral calibration models:  demonstration with infrared spectra of thin-film dielectrics on silicon","prefix":"10.1021","volume":"63","author":[{"given":"Indira S.","family":"Adhihetty","affiliation":[]},{"given":"Joseph A.","family":"McGuire","affiliation":[]},{"given":"Boonsri.","family":"Wangmaneerat","affiliation":[]},{"given":"Thomas M.","family":"Niemczyk","affiliation":[]},{"given":"David M.","family":"Haaland","affiliation":[]}],"member":"316","published-online":{"date-parts":[[2002,5]]},"container-title":"Analytical Chemistry","original-title":[],"link":[{"URL":"http:\/\/pubs.acs.org\/doi\/pdf\/10.1021\/ac00020a024","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,5,26]],"date-time":"2017-05-26T12:09:49Z","timestamp":1495800589000},"score":1.0,"subtitle":[],"short-title":[],"issued":{"date-parts":[[1991,10,15]]},"references-count":30,"alternative-id":["10.1021\/ac00020a024"],"URL":"http:\/\/dx.doi.org\/10.1021\/ac00020a024","relation":{},"ISSN":["0003-2700","1520-6882"],"subject":["Analytical Chemistry"],"container-title-short":"Anal. Chem."}